Electronic Components Datasheet Search
  New Zealand  ▼
ALLDATASHEET.CO.NZ

X  

AN4075 Datasheet(PDF) 18 Page - STMicroelectronics

Part # AN4075
Description  STEVAL-IFP016V2 IO-Link communication master transceiver
PDF  23 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

AN4075 Datasheet(HTML) 18 Page - STMicroelectronics

Back Button AN4075 Datasheet HTML 14Page - STMicroelectronics AN4075 Datasheet HTML 15Page - STMicroelectronics AN4075 Datasheet HTML 16Page - STMicroelectronics AN4075 Datasheet HTML 17Page - STMicroelectronics AN4075 Datasheet HTML 18Page - STMicroelectronics AN4075 Datasheet HTML 19Page - STMicroelectronics AN4075 Datasheet HTML 20Page - STMicroelectronics AN4075 Datasheet HTML 21Page - STMicroelectronics AN4075 Datasheet HTML 22Page - STMicroelectronics Next Button
Zoom Inzoom in Zoom Outzoom out
 18 / 23 page
background image
Application EMC immunity
AN4075
18/23
Doc ID 022954 Rev 1
4.2.2
Test signal
According the IEC 61000-4-4
●
Polarity: positive/negative
●
Burst duration: 15 ms ± 20% at 5 kHz
●
Burst period: 300 ms ± 20%
●
Duration time: 1 minute
●
Applied to: L+, C/Q, I/Q and L- lines through capacitive clamp
4.2.3
Test setup
The EFT signal was coupled to the supply voltage lines through the capacitive coupling
clamp which corresponds to approximately 150 pF.
The application supply voltage was provided by two 12 V lead battery cells.
Earth (reference plain) was connected to the application.
4.2.4
Conclusion
The application is immune against fast transient burst signals.
Burst applied to the IO-Link communication lines has no influence on the stability of the
L6360 internal registers.
4.3
EMC IEC 61000-4-5 surge immunity test
4.3.1
Test conditions
●
Supply voltage: 23 V (approximately)
●
Ambient temperature: 23 °C
●
L+, C/Q configured as mentioned in Table 6 to Table 8
●
Register values - see Section 4.1
●
L+, C/Q, I/Q lines left floating
Table 5.
Application EFT (burst) immunity, applied to IO-Link lines
(L+, C/Q, I/Q, L-)
Polarity
EFT test signal amplitude, test result
1 kV
2 kV
3 kV
4 kV
Positive (+)
A(1)
1.
The L6360 internal registers state stable; logic interface state changes not evaluated.
A(1)
A(1)
A(1)
Negative (-)
A(1)
A(1)
A(1)
A(1)



Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23


Datasheet Download

Go To PDF Page


Link URL



Does ALLDATASHEET help your business so far?  [ DONATE ] 

About Alldatasheet   |   Advertisement   |   Contact us   |   Privacy Policy   |   Link to Datasheet    |   Link Exchange   |   Manufacturer List
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com