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AN3181 Datasheet(PDF) 4 Page - STMicroelectronics |
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AN3181 Datasheet(HTML) 4 Page - STMicroelectronics |
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4 / 31 page ![]() List of figures AN3181 4/31 Doc ID 17286 Rev 2 List of figures Figure 1. Example of RAM memory configuration for STM8S20x . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Figure 2. Control flow four steps check routine . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 Figure 3. Diagnostic LED timing signal principle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Figure 4. Integration of startup and periodic run mode self tests into application . . . . . . . . . . . . . . . 17 Figure 5. startup self tests structure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 Figure 6. Watchdogs startup self test structure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 Figure 7. CPU startup self test structure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 Figure 8. FLASH startup self test structure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Figure 9. RAM startup self test structure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 Figure 10. Clock startup self test subroutine structure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 Figure 11. Periodic run mode self test initialization structure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 Figure 12. Periodic run mode self test and time base interrupt service structure . . . . . . . . . . . . . . . . 24 Figure 13. CPU light run mode self test structure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 Figure 14. Stack overflow run mode test structure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 Figure 15. Clock run mode self test structure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 Figure 16. Clock run mode self test principle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 Figure 17. Partial FLASH CRC run mode self test structure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 Figure 18. Partial RAM run mode self test structure) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 Figure 19. Fault coupling principle used at partial RAM run mode self test . . . . . . . . . . . . . . . . . . . . . 28 |
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