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AN3307 Datasheet(PDF) 11 Page - STMicroelectronics

Part # AN3307
Description  Guidelines for obtaining IEC 60335 Class B certification for any STM32 application
PDF  37 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

AN3307 Datasheet(HTML) 11 Page - STMicroelectronics

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AN3307
Compliance with IEC and VDE standards
Doc ID 18186 Rev 4
11/37
3.1
Generic tests included in the STM32Fxxx firmware library
The certified by VDE STM32Fxxx firmware library packages are composed of the following
micro-specific software modules:
●
CPU register test
●
Clock monitoring
●
RAM functional check
●
Flash checksum integrity check
●
Watchdog self-test
●
Stack overflow monitoring
An overview of the methods used for these MCU-specific tests is given in Table 2 and they
are described in more detail in the following chapters. The last two items from the list above
are not explicitly asked for by the norm, but they improve overall fault coverage.
Table 1.
MCU parts which must be tested for Class B compliance
Group
Components to be tested
Micro-specific
CPU registers
CPU program counter
Clock
Volatile & non-volatile memories
Internal addressing (and external memory addressing if any)
Internal data path
Application-specific
Interrupt handling
External communication
Timing
I/O peripherals
Analog A/D and D/A
Analog multiplexer



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