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AN3307 Datasheet(PDF) 17 Page - STMicroelectronics

Part # AN3307
Description  Guidelines for obtaining IEC 60335 Class B certification for any STM32 application
PDF  37 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

AN3307 Datasheet(HTML) 17 Page - STMicroelectronics

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AN3307
Class B software package
Doc ID 18186 Rev 4
17/37
4.2.2
Tool-specific integration of the library
Startup file
It is recommended to reuse the following compiler-specific files:
●
startup_STM32fxxx.s file where regular reset handler should be replaced by
STL_StartUp function address and checksum storage area should be defined (in case
of MDK-ARM compiler)
●
*.icf (for IAR) and *.sct (for KEIL) linker script files where all the memory regions
including Class B specific ones are defined
●
The workspace can also be used as an example (CRC generation is enabled in the
linker/ processing tab of project options with IAR).
●
Self-test startup routines do not alter or disable the compiler’s standard C startup files,
variables and stack/heap which are initialized in the usual way.
Defining new variables and memory sizes
Double storage in CLASS_B_RAM and CLASS_B_RAM_REV is necessary to ensure the
redundancy of the safety critical data (Class B). All other variables defined without any
particular attributes are considered as Class A variables and are not checked during the
transparent RAM test.
Class A and Class B variable region sizes can be modified in the linker configuration file.
New Class B variables must be declared in the stm32fxxx_STLclassBvar.h header file,
with the following syntax for the IAR development environment:
__no_init EXTERN uint32_t MyClassBvar @ "CLASS_B_RAM";
__no_init EXTERN uint32_t MyClassBvarInv @ "CLASS_B_RAM_REV";
and with the following syntax for the KEIL development environment:
EXTERN uint32_t MyClassBvar __attribute__((section("CLASS_B_RAM"), zero_init));
EXTERN uint32_t MyClassBvarInv __attribute__((section("CLASS_B_RAM_REV"), zero_init));
Note:
The start and end addresses of RAM/ROM regions are not exported when using the KEIL
environment. These address modifications must be edited in the stm32fxxx_STLparam.h
file, which contains addresses and constants required to do the RAM and ROM (Flash)
tests.
4.2.3
Application demo example
A short demo example of a user application is attached at main.c file related to the
dedicated project (see Chapter 5: Class B solution structure). It provides an example of how
the Class B routines can be integrated into an application-specific solution and demo
software controlling hardware of dedicated evaluation board.
The demo software uses the following hardware:
●
On board LCD screen to display basic status messages
●
Outputs to drive LEDs indicating that testing routines are executed properly. Dedicated
LEDs are toggled once the partial RAM or FLASH test is completed and at every
beginning and end of Class B testing procedures. These LED signals can be used to
measure duration and frequency of the tests. Some of the LEDs indicate partial
intervals of initial startup test, too. Please, follow the source code for more details.



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