MAC7101CVF datasheet(35/48 Pages) MOTOROLA

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MAC7100 Microcontroller Family Hardware Specifications

MOTOROLA

PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICE

Electrical Characteristics

3.13.2 NVM Reliability

The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process

monitors and burn-in to screen early life failures. The failure rates for data retention and program/erase

cycling are specified at the operating conditions noted. The program/erase cycle count on the sector is

incremented every time a sector or mass erase event is executed.

NOTE

All values shown in Table 37 are target values and subject to

characterization.

For Flash cycling performance, each Program operation must be preceded

by an erase.

Table 37. NVM Reliability Characteristics

Conditions shown in Table 6 unless otherwise noted.

Num

Rating

Min

Unit

Z10

C Program/Data Flash Program/Erase endurance (–40C to +125C)

10,000

Cycles

Z11

C Program/Data Flash Data Retention Lifetime

Years

Freescale Semiconductor, Inc.

For More Information On This Product,

Go to: www.freescale.com

MAC7101CVF Datasheet(PDF) 35 Page - Motorola, Inc