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ADC08B200CIVS/NOPB Datasheet(PDF) 31 Page - Texas Instruments

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Part # ADC08B200CIVS/NOPB
Description  200 MSPS A/D Converter with Capture Buffer
PDF  39 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

ADC08B200CIVS/NOPB Datasheet(HTML) 31 Page - Texas Instruments

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ADC08B200
www.ti.com
SNAS388F – MARCH 2007 – REVISED APRIL 2013
MODES OF OPERATION
The ADC08B200 has several modes of operation. These modes are detailed in Table 3.
The buffer function is controlled by the BSIZE pins, BSIZE0 and BSIZE1, as indicated in Table 4. The buffer can
be bypassed and data read directly from the ADC by setting both of the BSIZE pins low.
Table 3. Modes of Operation
PD
PDADC
WEN
REN
Power State
Operational State
1
x
x
x
Shutdown
Shutdown, non-operational
Buffer Active, ADC
0
1
0
0
ADC powered down, no data can be captured. Buffer may be read.
Shutdown
0
x
0
1
Active
Data is being read from buffer with RCLK
If buffer is bypassed, data is present at output bus. If buffer is used, the chip is
0
0
0
0
Active
ready to capture data to the buffer.
The ADC's digital output is being captured to the buffer. The REN input is
0
0
1
x
Active
ignored.
Buffer Active, ADC
0
1
1
x
PROHIBITED. WEN input is ignored.
Shutdown
Table 4. Buffer Write/Read
BSIZE1
BSIZE0
WEN
REN
Buffer Function
0
0
x
x
Buffer bypassed
0
1
1
x
Write to 256 byte buffer
1
0
1
x
Write to 512 byte buffer
1
1
1
x
Write to 1k byte buffer
0
1
0
1
Read from 256 byte buffer
1
0
0
1
Read from 512 byte buffer
1
1
0
1
Read from 1k byte buffer
TEST PATTERN OUTPUT
The ADC08B200 has a test mode whereby the data outputs have a test pattern which may be used to "train" a
receiving device, such as a PLD. The Test Mode is invoked by forcing a potential of VA/2 at the OEDGE/TEN
input. There is an on-chip pull-up resistor at this pin, so the device interprets a floating input at this pin to be a
logic high. This pattern is used to test the integrity of the buffer, so the RCLK (Read Clock) input must be used to
get the output pattern.
The test pattern that is put out is a continuously repeated pattern of output codes 00h - FFh - 00h - FFh - 00h.
Note that this pattern repeats as long as the test mode is invoked and RCLK is running, so that every second
time a logic low appears it will be present for two bit times.
APPLICATION EXAMPLE
Figure 47 shows an example of a typical application. The analog input and reference circuits are as described in
Figure 45 and Figure 46, except the input amplifier is shown without any gain and offset adjustments. The overall
nominal gain of the input amplifier circuit is 1.98 and the nominal
−3 dB input bandwidth is about 195 MHz. Note
that this circuit does not show an anti-aliasing filter.
A 50 MHz clock oscillator is used for the input clock source. The MULT0 input grounded and the MULT1 input
high means (from Table 1) that this 50 MHz input clock is multiplied by the internal PLL by 4 to provide a 200
Msps capture rate.
Since the BSIZE0 and BSIZE1 pins are both high, the internal capture buffer size is set to 1,024 bytes (see
Table 2). Data writing to the internal buffer will automatically stop when the buffer is full because the ASW input
is high. The FF (Full Flag) will go high when the buffer is full and data is ready to be read.
Copyright © 2007–2013, Texas Instruments Incorporated
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