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PARTNUMBER02 Datasheet(PDF) 26 Page - Texas Instruments

Part # PARTNUMBER02
Description  3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
PDF  31 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

PARTNUMBER02 Datasheet(HTML) 26 Page - Texas Instruments

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SN54LVT18502
3.3-V ABT SCAN TEST DEVICE
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS669 – JULY 1996
26
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (normal mode) (see Figure 14)123
VCC = 3.3 V
± 0.3 V
VCC = 2.7 V
UNIT
MIN
MAX
MIN
MAX
fclock
Clock frequency
CLKAB or CLKBA
0
90
0
80
MHz
t
Pulse duration
CLKAB or CLKBA high or low
6.5
6.7
ns
tw
Pulse duration
LEAB or LEBA high
2.4
2.4
ns
A before CLKAB
↑ or B before CLKBA↑
3.6
4
tsu
Setup time
A before LEAB
↓ or B before LEBA↓
CLK high
1.2
0.6
ns
A before LEAB
↓ or B before LEBA↓
CLK low
1.4
1.5
th
Hold time
A after CLKAB
↑ or B after CLKBA↑
1.2
0.8
ns
th
Hold time
A after LEAB
↓ or B after LEBA↓
4.9
5.4
ns
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (test mode) (see Figure 14)
VCC = 3.3 V
± 0.3 V
VCC = 2.7 V
UNIT
MIN
MAX
MIN
MAX
fclock
Clock frequency
TCK
0
50
0
40
MHz
tw
Pulse duration
TCK high or low
12
14
ns
A, B, CLK, LE, or OE before TCK
↑
8
9
tsu
Setup time
TDI before TCK
↑
3.5
4.5
ns
TMS before TCK
↑
3
4
A, B, CLK, LE, or OE after TCK
↑
1.7
1.1
th
Hold time
TDI after TCK
↑
1.5
0.8
ns
TMS after TCK
↑
1.5
0.6
td
Delay time
Power up to TCK
↑
50*
50*
ns
tr
Rise time
VCC power up
1*
1*
µs
* On products compliant to MIL-PRF-38535, this parameter is not production tested.



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