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LM4879ITL/NOPB Datasheet(PDF) 5 Page - Texas Instruments |
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LM4879ITL/NOPB Datasheet(HTML) 5 Page - Texas Instruments |
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5 / 32 page ![]() LM4879, LM4879MMBD, LM4879SDBD www.ti.com SNAS142G – SEPTEMBER 2001 – REVISED MAY 2013 ELECTRICAL CHARACTERISTICS VDD = 5V (1) (2) The following specifications apply for the circuit shown in Figure 1 unless otherwise specified. Limits apply for TA = 25°C. LM4879 Units Parameter Test Conditions (Limits) Typ(3) Limit(4)(5) IDD Quiescent Power Supply Current VIN = 0V, 8Ω BTL 5 10 mA (max) ISD Shutdown Current Vshutdown = GND 0.1 2.0 µA (max) VOS Output Offset Voltage 5 40 mV (max) Po Output Power THD+N = 1% (max); f = 1kHz 1.1 0.9 W (min) THD+N Total Harmonic Distortion+Noise Po = 0.4Wrms; f = 1kHz 0.1 % Vripple = 200mVsine p-p, CB = 1.0µF 68 (f = 1kHz) PSRR Power Supply Rejection Ratio 55 dB (min) 62 (f = 217Hz) Input terminated with 10 Ω to ground VSDIH Shutdown High Input Voltage 1.4 V (min) VSDIL Shutdown Low Input Voltage 0.4 V (max) TWU Wake-up Time CB = 1.0µF 80 110 ms (max) A-Weighted; Measured across 8 Ω BTL NOUT Output Noise 26 µVRMS Input terminated with 10 Ω to ground (1) All voltages are measured with respect to the ground pin, unless otherwise specified. (2) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not ensure specific performance limits. Electrical Characteristics state DC and AC electrical specifications under particular test conditions which ensure specific performance limits. This assumes that the device is within the Operating Ratings. Specifications are not ensured for parameters where no limit is given, however, the typical value is a good indication of device performance. (3) Typicals are measured at 25°C and represent the parametric norm. (4) Limits are specified to TI's AOQL (Average Outgoing Quality Level). (5) For DSBGA only, shutdown current is measured in a Normal Room Environment. Exposure to direct sunlight will increase ISD by a maximum of 2µA. ELECTRICAL CHARACTERISTICS VDD = 3.0V (1) (2) The following specifications apply for the circuit shown in Figure 1 unless otherwise specified. Limits apply for TA = 25°C. LM4879 Units Parameter Test Conditions (Limits) Typ(3) Limit(4)(5) IDD Quiescent Power Supply Current VIN = 0V, 8Ω BTL 4.5 9 mA (max) ISD Shutdown Current Vshutdown = GND 0.1 2.0 µA (max) VOS Output Offset Voltage 5 40 mV (max) Po Output Power THD+N = 1% (max); f = 1kHz 350 320 mW THD+N Total Harmonic Distortion+Noise Po = 0.15Wrms; f = 1kHz 0.1 % Vripple = 200mVsine p-p, CB = 1.0µF 68 (f = 1kHz) PSRR Power Supply Rejection Ratio 55 dB (min) 62 (f = 217Hz) Input terminated with 10 Ω to ground VSDIH Shutdown High Input Voltage 1.4 V (min) VSDIL Shutdown Low Input Voltage 0.4 V (max) TWU Wake-up Time CB = 1.0µF 80 110 ms (max) A-Weighted; Measured across 8 Ω NOUT Output Noise BTL 26 µVRMS Input terminated with 10 Ω to ground (1) All voltages are measured with respect to the ground pin, unless otherwise specified. (2) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not ensure specific performance limits. Electrical Characteristics state DC and AC electrical specifications under particular test conditions which ensure specific performance limits. This assumes that the device is within the Operating Ratings. Specifications are not ensured for parameters where no limit is given, however, the typical value is a good indication of device performance. (3) Typicals are measured at 25°C and represent the parametric norm. (4) Limits are specified to TI's AOQL (Average Outgoing Quality Level). (5) For DSBGA only, shutdown current is measured in a Normal Room Environment. Exposure to direct sunlight will increase ISD by a maximum of 2µA. Copyright © 2001–2013, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Links: LM4879 LM4879MMBD LM4879SDBD |
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