LMH6704

SNOSAD0C – FEBRUARY 2005 – REVISED MARCH 2013

www.ti.com

These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

Absolute Maximum Ratings

(1)

Human Body Model

2000V

Machine Model

200V

Supply Voltage

13.5V

(3)

Common-Mode Input Voltage

S

+

Maximum Junction Temperature

150°C

Storage Temperature Range

−65°C to 150°C

Infrared or Convection (20 sec.)

235°C

Soldering Information

Wave Soldering (10 sec.)

260°C

Lead Temp. (soldering 10 sec.)

300°C

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is intended to be functional, but specific performance is not ensured. For specifications, see the Electrical

Characteristics tables.

(2)

Human Body Model, applicable std. MIL-STD-883, Method 3015.7. Machine Model, applicable std. JESD22-A115-A (ESD MM std. of

JEDEC). Field-Induced Charge-Device Model, applicable std. JESD22-C101-C (ESD FICDM std. of JEDEC).

(3)

Operating Ratings

(1)

Nominal Supply Voltage

±4V to ±6V

−40°C to 85°C

Thermal Resistance

Package

(

(

8-Pin SOIC

75°C/W

160°C/W

6-Pin SOT23

120°C/W

187°C/W

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is intended to be functional, but specific performance is not ensured. For specifications, see the Electrical

Characteristics tables.

(2)

2

Submit Documentation Feedback

Copyright © 2005–2013, Texas Instruments Incorporated

Product Folder Links: LMH6704