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LMH6715QML-SP Datasheet(PDF) 2 Page - Texas Instruments

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Part # LMH6715QML-SP
Description  Dual Wideband Video Op Amp
PDF  18 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

LMH6715QML-SP Datasheet(HTML) 2 Page - Texas Instruments

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LMH6715QML
SNOSAQ3B – NOVEMBER 2010 – REVISED MAY 2013
www.ti.com
Absolute Maximum Ratings
(1)
Supply Voltage (VCC)
±6.75V
Common Mode Input Voltage (VCM)
V+ - V-
Differential Input Voltage
V+ - V-
Power Dissipation (PD)
(2)
1.0W
Lead Temperature (Soldering, 10 seconds)
+300°C
Junction Temperature (TJ)
+175°C
Storage Temperature Range
-65°C
≤ TA ≤ +150 °C
CDIP (Still Air)
140°C/W
θJA
CDIP (500LF/Min Air Flow)
80°C/W
CDIP
32°C/W
Thermal Resistance
θJC
Package Weight (typical)
Weight CDIP
1130mg
ESD Tolerance(3)
2000V
(1)
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not ensure specific performance limit s. For ensured specifications and test conditions, see the
Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may
degrade when the device is not operated under the listed test conditions.
(2)
The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature),
θJA (package junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any
temperature is PDmax = (TJmax - TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is lower.
(3)
Human body model, 1.5k
Ω in series with 100 pF.
Recommended Operating Ratings
Supply Voltage (VCC)
±5VDC to ±6VDC
Ambient Operating Temperature Range (TA)
-55°C
≤ TA ≤ +125°C
Quality Conformance Inspection
MIL-STD-883, Method 5005 - Group A
Subgroup
Description
Temp (°C)
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
2
Submit Documentation Feedback
Copyright © 2010–2013, Texas Instruments Incorporated
Product Folder Links: LMH6715QML



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