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©2016 Integrated Device Technology, Inc.

October 20, 2016

8P34S2108 Datasheet

AC Electrical Characteristics

[a]

Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device

is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal

equilibrium has been reached under these conditions.

Symbol

Parameter

Test Conditions

Minimum Typical

Maximum

Units

Input frequency

2GHz

V/t

Input edge rate

1.5

V/ns

[b]

Measured from the differential input crossing point to the differential output crossing point.

[c]

CLKA to any QAx, CLKB to any nQBx

100

255

400

ps

tsk(o)

20

40

ps

tsk(b)

Output bank skew[e], [f]

10

25

ps

tsk(p)

5

25

ps

tsk(pp)

Part-to-part skew[e], [h]

200

ps

Buffer Additive Phase

Jitter, RMS;

500mV amplitude;

refer to Additive Phase

Jitter

Integration range: 1kHz – 40MHz

60

80

fs

Integration range: 12kHz – 20MHz

45

60

fs

phase noise

30MHz offset from carrier and noise floor

< -160

dBc/Hz

Spurious suppression,

coupling between

channels

measured between neighboring outputs

-59

dB

measured between neighboring outputs

-59

dB

Output rise/ fall time

10% to 90%, outputs loaded with 100



150

400

ps

20% to 80%, outputs loaded with 100



90

160

ps

Input voltage

amplitude

CLKA,

CLKB

0.15

1.2

V

Differential

input voltage

amplitude

CLKA,

CLKB

0.3

2.4

V

Common mode

1.1

Differential

output voltage

SELAA, SELAB = 0,

outputs loaded with 100



247

350

454

mV

SELAA, SELAB = 1,

outputs loaded with 100



350

500

650

mV

Offset voltage

SELAA, SELAB = 0

0.8

V

SELAA, SELAB = 1

0.7

V