STM32L151X8 datasheet(101/133 Pages) STMICROELECTRONICS

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STM32L151x6/8/B STM32L152x6/8/B

Electrical characteristics

104

Figure 31. 12-bit buffered /non-buffered DAC

1. The DAC integrates an output buffer that can be used to reduce the output impedance and to drive external

loads directly without the use of an external operational amplifier. The buffer can be bypassed by

configuring the BOFFx bit in the DAC_CR register.

6.3.19

Temperature sensor characteristics

Table 58. Temperature sensor calibration values

Calibration value name

Description

Memory address

TS_CAL1

TS ADC raw data acquired at

temperature of 30 °C,

VDDA= 3 V

0x1FF8 007A-0x1FF8 007B

TS_CAL2

TS ADC raw data acquired at

temperature of 110 °C

VDDA= 3 V

0x1FF8 007E-0x1FF8 007F

Table 59. Temperature sensor characteristics

Symbol

Parameter

Min

Typ

Max

Unit

TL(1)

1. Guaranteed by characterization results.

VSENSE linearity with temperature

±1

±2°C

Avg_Slope(1)

Average slope

1.48

1.61

1.75

mV/°C

V110

Voltage at 110°C ±5°C(2)

2. Measured at VDD = 3 V ±10 mV. V110 ADC conversion result is stored in the TS_CAL2 byte.

612

626.8

641.5

IDDA(TEMP)(3)

Current consumption

3.4

µA

tSTART(3)

3. Guaranteed by design.

Startup time

µs

TS_temp(4)(3)

4. Shortest sampling time can be determined in the application by multiple iterations.

ADC sampling time when reading the

temperature

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