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STM32F102xx Datasheet(PDF) 20 Page - STMicroelectronics |
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STM32F102xx Datasheet(HTML) 20 Page - STMicroelectronics |
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20 / 41 page ![]() STM32F10xx8 and STM32F10xxB silicon limitations STM32F10xx8 STM32F10xxB 20/41 DocID14574 Rev 13 However, the boundary scan TAP shifts out the latest value loaded into the instruction register, which could be “00”, “01”, “10” or “11”. Workaround The data shifted out, after the capture IR state, in the boundary scan flow should therefore be ignored and the software should check not only the two least significant bits (XXX01) but all register bits (XXXXX). 2.12 Flash memory BSY bit delay versus STRT bit setting Description When the STRT bit in the Flash memory control register is set (to launch an erase operation), the BSY bit in the Flash memory status register goes high one cycle later. Therefore, if the FLASH_SR register is read immediately after the FLASH_CR register is written (STRT bit set), the BSY bit is read as 0. Workaround Read the BSY bit at least one cycle after setting the STRT bit. |
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