STM32F383VC datasheet(59/125 Pages) STMICROELECTRONICS

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STM32F383xx

Electrical characteristics

109

6.3.3

Embedded reference voltage

The parameters given in Table 25 are derived from tests performed under ambient

temperature and VDD supply voltage conditions summarized in Table 22.

Table 24. Embedded internal reference voltage calibration values

Calibration value name

Description

Memory address

VREFINT_CAL

Raw data acquired at

temperature of 30 °C

VDDA= 3.3 V

0x1FFF F7BA - 0x1FFF F7BB

Table 25. Embedded internal reference voltage

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

VREFINT

Internal reference voltage

–40 °C < TA < +105 °C 1.16

1.21

1.26

–40 °C < TA < +85 °C 1.16

1.20 1.24(1)

TS_vrefint(2)

ADC sampling time when reading the

internal reference voltage

17.10

µs

VREFINT_s(3)

Internal reference voltage spread over the

temperature range

VDD = 3 V ±10 mV

TCoeff(3)

Temperature coefficient

100

ppm/°C

tSTART(3)

Startup time

µs

tVREFINT_RD

(4)

Internal reference voltage temporization

1.50

2.50

4.50

1. Data based on characterization results, not tested in production.

2. Shortest sampling time can be determined in the application by multiple iterations.

3. Guaranteed by design, not tested in production.

4. Guaranteed by design, not tested in production. Latency between the time when the NPOR pin is set to 1 by the application

and the time when the VREFINTRDYF bit is set to 1 by the hardware.

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