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STM32F410RB Datasheet(PDF) 90 Page - STMicroelectronics

Part # STM32F410RB
Description  Clock, reset and supply management
PDF  142 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32F410RB Datasheet(HTML) 90 Page - STMicroelectronics

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Electrical characteristics
STM32F410x8/B
90/142
DocID028094 Rev 5
In noisy environments, it is recommended to avoid pin exposition to disturbances. The pins
showing a middle range robustness are PA14 and PA15.
As a consequence, it is recommended to add a serial resistor (1 kΩ maximum) located as
close as possible to the MCU pins exposed to noise (connected to tracks longer than 50 mm
on PCB).
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
•
Corrupted program counter
•
Unexpected reset
•
Critical Data corruption (control registers...)
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application,
executing EEMBC code, is running. This emission test is compliant with SAE IEC61967-2
standard which specifies the test board and the pin loading.
Table 51. EMI characteristics for LQFP64
Symbol
Parameter
Conditions
Monitored
frequency band
Max vs.
[fHSE/fCPU]
Unit
8/100 MHz
SEMI
Peak level
VDD = 3.6 V, TA = 25 °C, conforming to
IEC61967-2
0.1 to 30 MHz
10
dBµV
30 to 130 MHz
11
130 MHz to 1 GHz
5
SAE EMI Level
2.5
-



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