Electronic Components Datasheet Search
  New Zealand  ▼
ALLDATASHEET.CO.NZ

X  

TMS320VC5506ZAYR Datasheet(PDF) 26 Page - Texas Instruments

Click here to check the latest version.
Part # TMS320VC5506ZAYR
Description  TMS320VC5506 Fixed-Point Digital Signal Processor
PDF  119 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

TMS320VC5506ZAYR Datasheet(HTML) 26 Page - Texas Instruments

Back Button TMS320VC5506ZAYR Datasheet HTML 22Page - Texas Instruments TMS320VC5506ZAYR Datasheet HTML 23Page - Texas Instruments TMS320VC5506ZAYR Datasheet HTML 24Page - Texas Instruments TMS320VC5506ZAYR Datasheet HTML 25Page - Texas Instruments TMS320VC5506ZAYR Datasheet HTML 26Page - Texas Instruments TMS320VC5506ZAYR Datasheet HTML 27Page - Texas Instruments TMS320VC5506ZAYR Datasheet HTML 28Page - Texas Instruments TMS320VC5506ZAYR Datasheet HTML 29Page - Texas Instruments TMS320VC5506ZAYR Datasheet HTML 30Page - Texas Instruments Next Button
Zoom Inzoom in Zoom Outzoom out
 26 / 119 page
background image
Introduction
26
October 2006 − Revised January 2008
SPRS375C
Table 2−3. Signal Descriptions (Continued)
TERMINAL
NAME
RESET
CONDITION
BK‡
FUNCTION
I/O/Z†
MULTIPLEXED
SIGNAL NAME
TEST/EMULATION PINS
TCK
I
IEEE standard 1149.1 test clock. TCK is normally a free-running clock
signal with a 50% duty cycle. The changes on test access port (TAP) of
input signals TMS and TDI are clocked into the TAP controller, instruction
register, or selected test data register on the rising edge of TCK. Changes
at the TAP output signal (TDO) occur on the falling edge of TCK.
PU
H
Input
TDI
I
IEEE standard 1149.1 test data input. Pin with internal pullup device. TDI is
clocked into the selected register (instruction or data) on a rising edge of
TCK.
PU
Input
TDO
O/Z
IEEE standard 1149.1 test data output. The contents of the selected
register (instruction or data) are shifted out of TDO on the falling edge of
TCK. TDO is in the high-impedance state except when the scanning of
data is in progress.
Hi-Z
TMS
I
IEEE standard 1149.1 test mode select. Pin with internal pullup device.
This serial control input is clocked into the TAP controller on the rising edge
of TCK.
PU
Input
TRST
I
IEEE standard 1149.1 test reset. TRST, when high, gives the IEEE
standard 1149.1 scan system control of the operations of the device. If
TRST is not connected or driven low, the device operates in its functional
mode, and the IEEE standard 1149.1 signals are ignored. This pin has an
internal pulldown.
PD
FS
Input
EMU0
I/O/Z
Emulator 0 pin. When TRST is driven low, EMU0 must be high for
activation of the OFF condition. When TRST is driven high, EMU0 is used
as an interrupt to or from the emulator system and is defined as I/O by way
of the IEEE standard 1149.1 scan system.
PU
Input
EMU1/OFF
I/O/Z
Emulator 1 pin/disable all outputs. When TRST is driven high, EMU1/OFF
is used as an interrupt to or from the emulator system and is defined as I/O
by way of IEEE standard 1149.1 scan system. When TRST is driven low,
EMU1/OFF is configured as OFF. The EMU1/OFF signal, when
active-low, puts all output drivers into the high-impedance state. Note that
OFF is used exclusively for testing and emulation purposes (not for
multiprocessing applications). Therefore, for the OFF condition, the
following apply: TRST = low, EMU0 = high, EMU1/OFF = low
PU
Input
† I = Input, O = Output, S = Supply, Hi-Z = High-impedance
‡ BK = bus keeper (the bus keeper maintains the previous voltage level during reset or while the output pin is not driven), PU = pullup,
PD = pulldown, H = hysteresis input buffer, FS = fail-safe buffer



Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100  ...More


Datasheet Download

Go To PDF Page


Link URL



Does ALLDATASHEET help your business so far?  [ DONATE ] 

About Alldatasheet   |   Advertisement   |   Contact us   |   Privacy Policy   |   Link to Datasheet    |   Link Exchange   |   Manufacturer List
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com