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ACE24AC16C Datasheet(PDF) 1 Page - ACE Technology Co., LTD. |
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ACE24AC16C Datasheet(HTML) 1 Page - ACE Technology Co., LTD. |
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1 / 20 page ![]() ACE24AC16C Two-wire Serial EEPROM VER 1.1 1 Description The ACE24AC16C is 16,384 bits of serial Electrical Erasable and Programmable Read Only Memory, commonly known as EEPROM. They are organized as 2,048 words of 8 bits (1 byte) each. The devices are fabricated with proprietary advanced CMOS process for low power and low voltage applications. These devices are available in standard 8-lead DIP, 8-lead SOP, 8-lead MSOP, 8-lead TSSOP, 8-lead USON and 5-lead SOT-23/TSOT-23 packages. A standard 2-wire serial interface is used to address all read and write functions. Our extended VCC range (1.8V to 5.5V) devices enables wide spectrum of applications. Features ⚫ Low voltage and low power operations: ⚫ ACE24AC16C: VCC = 1.8V to 5.5V, Industrial temperature range (-40℃ to 85℃). ⚫ Maximum Standby current < 1µA (typically 0.02µA and 0.06µA @ 1.8V and 5.5V respectively). ⚫ 16 bytes page write mode. ⚫ Partial page write operation allowed. ⚫ Internally organized: 2048× 8 (16K). ⚫ Standard 2-wire bi-directional serial interface. ⚫ Schmitt trigger, filtered inputs for noise protection. ⚫ Self-timed programming cycle (5ms maximum). ⚫ 1 MHz (2.5-5V), 400 kHz (1.8V) Compatibility. ⚫ Automatic erase before write operation. ⚫ Write protect pin for hardware data protection. ⚫ High reliability: typically 1,000,000 cycles endurance. ⚫ 100 years data retention. ⚫ Standard 8-pin DIP/SOP/MSOP/TSSOP/USON and 5-pin SOT-23/TSOT-23 Pb-free packages. Absolute Maximum Ratings Industrial operating temperature -40℃to 85℃ Storage temperature -50℃ to 125℃ Input voltage on any pin relative to ground -0.3V to VCC + 0.3V Maximum voltage 8V ESD protection on all pins >4000V *Notice: Stresses exceed those listed under “Absolute Maximum Rating” may cause permanent damage to the device. Functional operation of the device at conditions beyond those listed in the specification is not guaranteed. Prolonged exposure to extreme conditions may affect device reliability or functionality. |
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