STM32L053C8 datasheet(130/136 Pages) STMICROELECTRONICS

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Revision history

STM32L053x6 STM32L053x8

130/136

DS10152 Rev 9

Revision history

Table 86. Document revision history

Date

Revision

Changes

07-

Feb-

2014

Initial release.

29-Apr-

2014

Updated Table 4: Functionalities depending on the working mode (from

Run/active down to standby). Added Section 3.2: Interconnect matrix.

Updated Figure 4: STM32L053x6/8 TFBGA64 ballout. Added VREF_OUT

additional function to PB0 and PB1, replaced TTa I/O structure by TC, and

updated PA0/4/5 and PC5/14 I/O structure, and added note 2 in Table 15:

STM32L053x6/8 pin definitions.

Updated Table 24: General operating conditions, Table 21: Voltage

characteristics and Table 22: Current characteristics.

Modified conditions in Table 27: Embedded internal reference voltage.

Updated Table 28: Current consumption in Run mode, code with data

processing running from Flash, Table 30: Current consumption in Run mode,

code with data processing running from RAM, Table 32: Current consumption

in Sleep mode, Table 33: Current consumption in Low-power run mode,

Table 34: Current consumption in Low-power sleep mode,Table 35: Typical and

maximum current consumptions in Stop mode and Table 36: Typical and

maximum current consumptions in Standby mode. Added Figure 12: IDD vs

VDD, at TA= 25/55/85/105 °C, Run mode, code running from Flash memory,

Range 2, HSE, 1WS, Figure 13: IDD vs VDD, at TA= 25/55/85/105 °C, Run

mode, code running from Flash memory, Range 2, HSI16, 1WS, Figure 14: IDD

vs VDD, at TA= 25/55/ 85/105/125 °C, Low-power run mode, code running

from RAM, Range 3, MSI (Range 0) at 64 KHz, 0 WS, Figure 15: IDD vs VDD,

at TA= 25/55/ 85/105/125 °C, Stop mode with RTC enabled and running on

LSE Low drive and Figure 16: IDD vs VDD, at TA= 25/55/85/105/125 °C, Stop

mode with RTC disabled, all clocks OFF.

Updated Table 43: HSE oscillator characteristics and Table 44: LSE oscillator

characteristics. Added Figure 21: HSI16 minimum and maximum value versus

temperature.

Updated Table 55: ESD absolute maximum ratings, Table 57: I/O current

injection susceptibility, Table 58: I/O static characteristics.

Added Figure 22: VIH/VIL versus VDD (CMOS I/Os) and Figure 23: VIH/VIL

versus VDD (TTL I/Os).

Updated Table 59: Output voltage characteristics, Table 60: I/O AC

characteristics and Figure 24: I/O AC characteristics definition.

Updated Table 62: ADC characteristics, Table 64: ADC accuracy, and

Figure 27: Typical connection diagram using the ADC. Updated Table 66:

Temperature sensor calibration values.

Updated Table 72: SPI characteristics in voltage Range 1 and Table 75: I2S

characteristics.

Added Figure 49: Thermal resistance.

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