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STM32F303X6 Datasheet(PDF) 95 Page - STMicroelectronics

Part # STM32F303X6
Description  Arm® Cortex®-M4 32b MCUFPU, up to 64KB Flash, 16KB SRAM, 2 ADCs, 3 DACs, 3 comp., op-amp 2.0 - 3.6 V
PDF  124 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32F303X6 Datasheet(HTML) 95 Page - STMicroelectronics

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DS9866 Rev 8
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STM32F303x6/x8
Electrical characteristics
102
Figure 30. ADC accuracy characteristics
Table 64. ADC accuracy(1)(2) at 1MSPS
Symbol
Parameter
Test conditions
Typ.
Max(3)
Unit
ET
Total unadjusted error
ADC Freq. ≤ 72 MHz
Sampling Freq. ≤ 1MSPS
2 V ≤ VDDA = VREF+ ≤ 3.6 V
Single-ended mode
Fast channel
±2.5
±5
LSB
Slow channel
±3.5
±5
EO
Offset error
Fast channel
±1
±2.5
Slow channel
±1.5
±2.5
EG
Gain error
Fast channel
±2
±3
Slow channel
±3
±4
ED
Differential linearity error
Fast channel
±0.7
± 2
Slow channel
±0.7
±2
EL
Integral linearity error
Fast channel
±1
±3
Slow channel
±1.2
±3
1. ADC DC accuracy values are measured after internal calibration.
2. ADC accuracy vs. negative Injection Current: Injecting negative current on any analog input pins must be avoided as this
significantly reduces the accuracy of the conversion being performed on another analog input. It is recommended to add a
Schottky diode (pin to ground) to analog pins which may potentially inject negative current. Any positive injection current
within the limits specified for IINJ(PIN) and ∑IINJ(PIN) in Section 6.3.14: I/O port characteristics does not affect the ADC
accuracy.
3. Data based on characterization results, not tested in production.
EO
EG
1LSBIDEAL
(1) Example of an actual transfer curve
(2) The ideal transfer curve
(3) End point correlation line
ET=Total Unadjusted Error: maximum deviation
between the actual and the ideal transfer curves.
EO=Offset Error: deviation between the first actual
transition and the first ideal one.
EG=Gain Error: deviation between the last ideal
transition and the last actual one.
ED=Differential Linearity Error: maximum deviation
between actual steps and the ideal one.
EL=Integral Linearity Error: maximum deviation
between any actual transition and the end point
correlation line.
4095
4094
4093
5
4
3
2
1
0
7
6
1
2
3
456
7
4093 4094 4095 4096
(1)
(2)
ET
ED
EL
(3)
VDDA
VSSA
VDDA
4096
1LSBIDEAL =
MS34980V1



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