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STM32F103XC Datasheet(PDF) 85 Page - STMicroelectronics |
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STM32F103XC Datasheet(HTML) 85 Page - STMicroelectronics |
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85 / 143 page ![]() DS5792 Rev 13 85/143 STM32F103xC, STM32F103xD, STM32F103xE Electrical characteristics 135 Figure 41. NAND controller waveforms for common memory write access Table 40. Switching characteristics for NAND Flash read and write cycles(1) 1. CL = 15 pF. Symbol Parameter Min Max Unit td(D-NWE)(2) 2. Guaranteed by characterization results. FSMC_D[15:0] valid before FSMC_NWE high 5tHCLK + 12 - ns tw(NOE)(2) FSMC_NWE low width 4tHCLK-1.5 4tHCLK+1.5 ns tsu(D-NOE)(2) FSMC_D[15:0] valid data before FSMC_NOE high 25 - ns th(NOE-D)(2) FSMC_D[15:0] valid data after FSMC_NOE high 7 - - tw(NWE)(2) FSMC_NWE low width 4tHCLK-1 4tHCLK+1 ns tv(NWE-D)(2) FSMC_NWE low to FSMC_D[15:0] valid - 0 ns th(NWE-D)(2) FSMC_NWE high to FSMC_D[15:0] invalid 2tHCLK + 4 - ns td(ALE-NWE)(3) 3. Guaranteed by design. FSMC_ALE valid before FSMC_NWE low - 3tHCLK + 1.5 ns th(NWE-ALE)(3) FSMC_NWE high to FSMC_ALE invalid 3tHCLK + 4.5 - ns td(ALE-NOE)(3) FSMC_ALE valid before FSMC_NOE low - 3tHCLK+ 2 ns th(NOE-ALE)(3) FSMC_NWE high to FSMC_ALE invalid 3tHCLK+ 4.5 - ns |
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