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LEO3910 Datasheet(PDF) 12 Page - STMicroelectronics

Part # LEO3910
Description  Rad-hard plastic 2 A positive low drop voltage regulator
PDF  21 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

LEO3910 Datasheet(HTML) 12 Page - STMicroelectronics

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8
Radiations
Total ionizing dose (TID):
The LEO3910 is tested and characterized according to condition A of MIL-STD-883.
All parameters provided in Table 4. Electrical characteristics apply to both pre- and post-irradiation, as follows:
•
Total ionizing dose (TID) are performed in accordance with MIL-STD-883
•
The initial characterization is performed in qualification only on both biased and unbiased parts
•
Each new production lot is tested at high dose rate, in the worst bias case condition, based on the results
obtained during the initial qualification.
Heavy-ions:
The behavior of the product when submitted to heavy-ions is not tested in production. Heavy-ion trials are
performed on qualification lots only.
Table 5. Radiations
Symbol
Characteristics
Value
TID (1)
•
High-dose rate (40 krad (Si)/h)
–
Temperature 25 °C
–
Performed on 5 biased parts
•
Low-dose rate (10 mrad (Si)/s)
Within Table 4. Electrical characteristics up to 50
krad(Si)
SEL(2)
•
Let: 62.5 MeV.cm2mg (Xenon ions)
•
Temperature 125 °C
•
Fluence of 1 x 107 n/cm² (10 million of particles per cm²)
•
Normal incidence
Immune to SEL up to 62.5 MeV.cm²/mg
SET
•
Temperature 25 °C
Characterized
TNID
•
(with 50 MeV protons)
Up to 3x1011 protons/cm²
1. A total ionizing dose (TID) of 50 krad(Si) is equivalent to 500 Gy(Si), (1 gray = 100 rad).
2. SEL: single event latchup.
LEO3910
Radiations
DS13691 - Rev 2
page 12/21



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