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STM32H753II Datasheet(PDF) 359 Page - STMicroelectronics |
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STM32H753II Datasheet(HTML) 359 Page - STMicroelectronics |
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359 / 361 page ![]() Revision history STM32H753xI 358/360 DS12117 Rev 8 4-Mar-2022 8 (continued) Section 6: Electrical characteristics (rev Y) (continued) – Updated ts(IN) and th(IN) in Table 83: QUADSPI characteristics in SDR mode tsr(IN)/tsf(IN) and thr(IN)/thf(IN) in Table 84: QUADSPI characteristics in DDR mode. Updated Figure 38: Quad-SPI timing diagram - DDR mode. – Updated maximum sampling time (tS) value in Table 86: ADC characteristics. Updated Figure 39: ADC accuracy characteristics, Figure 40: Typical connection diagram when using the ADC with FT/TT pins featuring analog switch function and Figure 41: Power supply and reference decoupling (VREF+ not connected to VDDA). – Updated TL maximum value in Table 91: Temperature sensor characteristics. – Updated fDFSDMCLK and DuCyCKOUT in Table 99: DFSDM measured timing - 1.62- 3.6 V. – Updated fTIMxCLK to match an APB1/2 maximum frequency of 120 MHZ in Table 102: TIMx characteristics. – Updated tsu(MI) and th(MI) minimum values in Table 105: SPI dynamic characteristics. – Updated tISU, tIH, tISUD and tIHD in Table 109: Dynamic characteristics: SD / MMC characteristics, VDD = 2.7 to 3.6 V, and tISU, tIH in Table 110: Dynamic characteristics: eMMC characteristics, VDD = 1.71 to 1.9 V. Updated Figure 58: DDR mode. Section 7: Electrical characteristics (rev V): – Updated Figure 67: Power supply scheme. – Updated Section 7.2: Absolute maximum ratings introduction to device mission profile. – Power dissipation (PD) removed from Table 121: General operating conditions since this parameter is redundant with ΘJA thermal resistance. – Replaced Min VDD by Min VDDLDO in Table 122: Supply voltage and maximum frequency configuration. – Updated Table 138: High-speed external user clock characteristics. – Table 149: Flash memory programming: removed reference to single bank configuration in title, and updated tERASE128KB. – Updated condition related to frcc_c_ck in Section : On-chip peripheral current consumption. – Added reference to AN4899 in Section 7.3.15: I/O port characteristics. Updated Fmax for speed 10 and 11 in Table 159: Output timing characteristics (HSLV OFF). Changed capacitance value for speed 10 and tr/tf, and speed for 11 and tr/tf/Fmax Table 160: Output timing characteristics (HSLV ON). – Updated tsu(DV-CLKH)/th(DV-CLKH) and tsu(NWAIT-CLKH)/th(NWAIT-CLKH) in Table 170: Synchronous multiplexed NOR/PSRAM read timings. Changed t(NWAIT-CLKH) to tsu(NWAIT-CLKH) and updated tsu(DV-CLKH)/th(DV-CLKH) and tsu(NWAIT-CLKH)/th(NWAIT- CLKH) in Table 172: Synchronous non-multiplexed NOR/PSRAM read timings. Updated tsu(SDCLKH _Data) and th(SDCLKH _Data) in Table 176: SDRAM read timings and Table 177: LPSDR SDRAM read timings. Replaced FMC_CLK by FMC_SDCLK in Section : SDRAM waveforms and timings. – Updated ts(IN) and th(IN) in Table 180: QUADSPI characteristics in SDR mode and tsr(IN)/tsf(IN) and thr(IN)/thf(IN) in Table 181: QUADSPI characteristics in DDR mode. Updated Figure 90: Quad-SPI timing diagram - DDR mode. Table 230. Document revision history Date Revision Changes |
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