MCP3004/3008

DS21295C-page 2

© 2007 Microchip Technology Inc.

1.0

ELECTRICAL

CHARACTERISTICS

Absolute Maximum Ratings*

Storage temperature ..........................-65°C to +150°C

Ambient temp. with power applied .....-65°C to +125°C

Soldering temperature of leads (10 seconds) .. +300°C

ESD protection on all pins .................................. > 4 kV

*Notice: Stresses above those listed under "Maximum

Ratings" may cause permanent damage to the device. This is

a stress rating only and functional operation of the device at

those or any other conditions above those indicated in the

operation listings of this specification is not implied. Exposure

to maximum rating conditions for extended periods may affect

device reliability.

PIN FUNCTION TABLE

Name

Function

+2.7V to 5.5V Power Supply

DGND

Digital Ground

AGND

Analog Ground

CH0-CH7

Analog Inputs

CLK

Serial Clock

Serial Data In

Serial Data Out

CS/SHDN

Chip Select/Shutdown Input

Reference Voltage Input

ELECTRICAL SPECIFICATIONS

Parameter

Sym

Min

Typ

Max

Units

Conditions

Conversion Rate

Conversion Time

—

—

10

clock

cycles

Analog Input Sample Time

1.5

clock

cycles

Throughput Rate

——

200

75

ksps

ksps

DC Accuracy

Resolution

10

bits

Integral Nonlinearity

INL

—

±0.5

±1

LSB

Differential Nonlinearity

DNL

—

±0.25

±1

LSB

No missing codes over

temperature

Offset Error

—

—

±1.5

LSB

Gain Error

—

—

±1.0

LSB

Dynamic Performance

Total Harmonic Distortion

—

-76

dB

Signal to Noise and Distortion

(SINAD)

—61

dB

Spurious Free Dynamic Range

—

78

dB

Reference Input

Voltage Range

0.25

—

V

Note 2

Current Drain

—

100

0.001

150

3

µA

µA

Note 1: This parameter is established by characterization and not 100% tested.

3: Because the sample cap will eventually lose charge, effective clock rates below 10 kHz can affect linearity

performance, especially at elevated temperatures. See Section 6.2, “Maintaining Minimum Clock Speed”,

for more information.