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TA84006F/FG Datasheet(PDF) 16 Page - Toshiba Semiconductor |
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TA84006F/FG Datasheet(HTML) 16 Page - Toshiba Semiconductor |
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16 / 22 page ![]() TA84006F/FG 2006-3-6 16 Test Circuit 9: VCMP, VOL (CMP), ROH (CMP) (1) Where output phase 2 is High (10.92 V) and phase 1 is Low ( = 9.88 V), set SW1 = A and measure V2 = VOL (CMP). (2) Where output phase 1 is High (10.92 V) and phase 2 is Low (9.88 V), set SW1 = B and confirm that 5 V × 10 kΩ/(10 kΩ + 13 kΩ) < V2 < 5 V × 10 kΩ/(10 kΩ + 7 kΩ). Test Circuit 10: VRF, VOH (ISD), VOL (ISD) (1) Where VISD = 0.55 V, set SW2 = A and measure V3 = VOH (ISD). (2) Where VISD = 0.45 V, set SW2 = B and measure V3 = VOL (ISD). 17 1 2 27 29 4 10 11 12 13 14 15 18 19 28 30 3 6 25 16 7 24 21 20 9 TA84006F/FG V2 V 10 k Ω B SW1 A 17 1 2 27 29 4 10 11 12 13 14 15 18 19 28 30 3 6 25 16 7 24 21 20 9 TA84006F/FG V3 V 0.1 mA B SW2 A 0.1 mA |
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