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AFE10004RGETEP Datasheet(PDF) 39 Page - Texas Instruments |
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AFE10004RGETEP Datasheet(HTML) 39 Page - Texas Instruments |
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39 / 159 page ![]() 6.3.5.2.1 EEPROM Integrity Check Before completing the EEPROM load sequence, a CRC error-check is performed by the device. The CRC polynomial is x12 + x11 + x3 + x2 + x + 1. The CRC check result is reported through the EECRC bit. If a CRC error is detected, the operating memory values are compromised; reset the device or burn the EEPROM again for proper operation. For added robustness, a single error correction and double error detection (SECDED) circuit based on the Hamming code is added to data in the LUT pages (Page 4 and Page 5). The SECDED circuit uses four Hamming code bits and a parity bit. The interleaved Hamming and LUT data are stored in EEPROM, and Table 6-10 shows these bits. Table 6-10. Hamming Code and LUT Data Bits DATA AND BIT POSITION 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 Data and Hamming code bits in operating memory P H3 H2 H1 H0 X X X D7 D6 D5 D4 D3 D2 D1 D0 Data and Hamming code interleaved bits X X X D7 D6 D5 D4 H3 D3 D2 D1 H2 D0 H1 H0 P The SECDED circuit checks the data integrity on every LUT register access. The parity bit (P) and four Hamming code bits (H[3:0]) in the HAMM registers equal all zeros if no error is present in the associated LUT data register. If P = 1 then a single error has been detected and corrected. The value in the H[3:0] bits represents the position of the bit error with respect to the interleaved bits. For example, if P = 1 and H[3:0] = 0x5, an error is detected and corrected in D1. If P = 0 and H[3:0] ≠ 0, then a double error has been detected. No correction is done in this case. Table 6-11 summarizes the device EEPROM integrity checks. Table 6-11. Status of EEPROM Access STATUS BIT NAME DESCRIPTION EECRC 0 = No CRC error detected. 1 = A CRC error is detected during a EEPROM load. The operating memory data are compromised. EERDY 0 = The EEPROM burn is in progress. 1 = The EEPROM burn is complete. DED 0 = No double-bit error detected. 1 = A double-bit error is detected when accessing a LUT register in the operating memory. The error is not corrected. SED 0 = No single-bit error detected. 1 = A single-bit error is detected when accessing a LUT register in the operating memory. The error is corrected. www.ti.com AFE10004-EP SLASFM1A – JUNE 2025 – REVISED DECEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 39 Product Folder Links: AFE10004-EP |
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