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AFE10004RGETEP Datasheet(PDF) 39 Page - Texas Instruments

Part # AFE10004RGETEP
Description  AFE10004-EP 4-Channel Power-Amplifier Precision Analog Front End With Integrated EEPROM and Gate Bias Switches
PDF  159 Pages
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Manufacturer  TI2 [Texas Instruments]
Direct Link  https://www.ti.com
Logo TI2 - Texas Instruments

AFE10004RGETEP Datasheet(HTML) 39 Page - Texas Instruments

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6.3.5.2.1 EEPROM Integrity Check
Before completing the EEPROM load sequence, a CRC error-check is performed by the device. The CRC
polynomial is x12 + x11 + x3 + x2 + x + 1. The CRC check result is reported through the EECRC bit. If a CRC
error is detected, the operating memory values are compromised; reset the device or burn the EEPROM again
for proper operation.
For added robustness, a single error correction and double error detection (SECDED) circuit based on the
Hamming code is added to data in the LUT pages (Page 4 and Page 5). The SECDED circuit uses four
Hamming code bits and a parity bit. The interleaved Hamming and LUT data are stored in EEPROM, and Table
6-10 shows these bits.
Table 6-10. Hamming Code and LUT Data Bits
DATA AND BIT POSITION
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
0
Data and Hamming code bits in operating
memory
P
H3
H2
H1
H0
X
X
X
D7
D6
D5
D4
D3
D2
D1
D0
Data and Hamming code interleaved bits
X
X
X
D7
D6
D5
D4
H3
D3
D2
D1
H2
D0
H1
H0
P
The SECDED circuit checks the data integrity on every LUT register access. The parity bit (P) and four Hamming
code bits (H[3:0]) in the HAMM registers equal all zeros if no error is present in the associated LUT data register.
If P = 1 then a single error has been detected and corrected. The value in the H[3:0] bits represents the position
of the bit error with respect to the interleaved bits. For example, if P = 1 and H[3:0] = 0x5, an error is detected
and corrected in D1.
If P = 0 and H[3:0] ≠ 0, then a double error has been detected. No correction is done in this case.
Table 6-11 summarizes the device EEPROM integrity checks.
Table 6-11. Status of EEPROM Access
STATUS BIT NAME
DESCRIPTION
EECRC
0 = No CRC error detected.
1 = A CRC error is detected during a EEPROM load. The operating
memory data are compromised.
EERDY
0 = The EEPROM burn is in progress.
1 = The EEPROM burn is complete.
DED
0 = No double-bit error detected.
1 = A double-bit error is detected when accessing a LUT register in the
operating memory. The error is not corrected.
SED
0 = No single-bit error detected.
1 = A single-bit error is detected when accessing a LUT register in the
operating memory. The error is corrected.
www.ti.com
AFE10004-EP
SLASFM1A – JUNE 2025 – REVISED DECEMBER 2025
Copyright © 2025 Texas Instruments Incorporated
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Product Folder Links: AFE10004-EP



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