HAL710 datasheet(17/19 Pages) MICRONAS

17 / 19 page

DATA SHEET

HAL 710, HAL 730

Micronas

Oct. 13, 2009; DSH000031_002EN

5. Application Notes

5.1. Ambient Temperature

Due to the internal power dissipation, the temperature

on the silicon chip (junction temperature TJ) is higher

than the temperature outside the package (ambient

temperature TA).

At static conditions and continuous operation, the fol-

lowing equation applies:

For typical values, use the typical parameters. For

worst case calculation, use the max. parameters for

IDD and Rth, and the max. value for VDD from the appli-

cation.

For all sensors, the junction temperature range TJ is

specified. The maximum ambient temperature TAmax

can be calculated as:

5.2. Extended Operating Conditions

All sensors fulfill the electrical and magnetic character-

istics when operated within the Recommended Oper-

ating Conditions (see Section 3.5. on page 10).

Supply Voltage Below 3.8 V

Typically, the sensors operate with supply voltages

above 3 V, however, below 3.8 V some characteristics

may be outside the specification.

Note: The functionality of the sensor below 3.8 V is

not tested. For special test conditions, please

contact Micronas.

5.3. Signal Delay

The extra circuitry required for the direction detection

increases the latency of the Count and Direction Sig-

nal compared to a simple switch (e.g., HAL 525). This

extra delay corresponds to 0.5 and 1 clock period for

the Direction Signal and Count Signal respectively.

5.4. Test Mode Activation

In order to obtain the normal operation as described

above, two external pull-up resistors with appropriate

values are required to connect each output to an exter-

nal supply, such that the potential at the open-drain

output rises to at least 3 V in less than 10 µs after hav-

ing turned off the corresponding pull-down transistor or

after having applied VDD.

If the Direction Output is pulled low externally (the

potential does not rise after the internal pull-down tran-

sistor has been turned off), the device enters Manufac-

turer Test Mode.

Direction detection is not functional in Manufacturer

Test Mode. The device returns to normal operation as

soon as the Count Output goes high.

Note: The presence of a Manufacturer Test Mode

requires appropriate measures to prevent acci-

dental activation (e.g., in response to EMC

events).

Amax

Jmax

–

HAL710 Datasheet(PDF) 17 Page - Micronas

HAL710 Datasheet(HTML) 17 Page - Micronas

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19

Datasheet Download

Link URL