E4

A4

B4

D4

DAT1B

DAT2B

DAT3B

DAT0B

DAT1B

CLKB

CMDB

CLKB

DAT0B

0

1

2

3

4

5

6

7

8

10

11

12

VCCA

DAT0A

DAT1A

DAT2A

DAT3A

CMDA

CLKA

CLK-f

GND

GND

VCCB

DAT0B

DAT1B

DAT2B

DAT3B

CMDB

CLKB

VDDA

DAT0

DAT1

DAT2

DAT3

CMD

CLK

CLKin

GND

CD

DAT2

DAT3

CMD

VSS1

VDD

CLK

VSS2

DAT0

DAT1

CD (Physical)

GND

GND

A2

D1

E1

A1

B1

C1

D2

E2

C2

C3

Processor

SD/SDIO MMC

TXS0206A

C3

0.1 µF

C4

0.1 µF

C1

0.1 µF

U1A

U2

J1

DAT2B

DAT3B

CMDB

B3

C4

D3

CD

Standard SD Card

CD

CD

B2

14 WP (Physical)

VCCA

WP

E4

A4

B4

D4

DAT1B

DAT2B

DAT3B

DAT0B

DAT1B

CLKB

CMDB

CLKB

DAT0B

0

1

2

3

4

5

6

7

8

10

11

12

VCCA

DAT0A

DAT1A

DAT2A

DAT3A

CMDA

CLKA

CLK-f

GND

GND

VCCB

DAT0B

DAT1B

DAT2B

DAT3B

CMDB

CLKB

VDDA

DAT0

DAT1

DAT2

DAT3

CMD

CLK

CLKin

GND

CD

DAT2

DAT3

CMD

VSS1

VDD

CLK

VSS2

DAT0

DAT1

CD (Physical)

GND

GND

A2

D1

E1

A1

B1

C1

D2

E2

C2

C3

Processor

SD/SDIO MMC

TXS0206A

C3

0.1 µF

C4

0.1 µF

C1

0.1 µF

U1A

U2

J1

DAT2B

DAT3B

CMDB

B3

C4

D3

CD

54794-0978

Micro SD

CD

CD

B2

TXS0206A

SCES833A – NOVEMBER 2011 – REVISED MAY 2012

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

REFERENCE CIRCUIT

Figure 1. Interfacing With SD/SDIO Card

Figure 2. Interfacing With Seperate WP and CD Pin

2

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