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SPC5668EF1AVMGR Datasheet(PDF) 44 Page - Freescale Semiconductor, Inc |
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SPC5668EF1AVMGR Datasheet(HTML) 44 Page - Freescale Semiconductor, Inc |
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44 / 66 page ![]() MPC5668x Microcontroller Data Sheet, Rev. 6 Electrical Characteristics Freescale Semiconductor 44 4.14.3 JTAG (IEEE 1149.1) Interface Figure 9. JTAG Test Clock Input Timing Table 26. JTAG Interface Timing1 1 These specifications apply to JTAG boundary scan only. JTAG timing specified at V DDE =3.0–5.5 V, TA =TL to TH, and CL = 30 pF with SRC = 0b11. Spec Characteristic Symbol Min Max Unit 1 TCK Cycle Time tJCYC 100 — ns 2 TCK Clock Pulse Width (Measured at VDDE/2) tJDC 40 60 ns 3 TCK Rise and Fall Times (40% – 70%) tTCKRISE —3 ns 4 TMS, TDI Data Setup Time tTMSS, tTDIS 5— ns 5 TMS, TDI Data Hold Time tTMSH, tTDIH 25 — ns 6 TCK Low to TDO Data Valid tTDOV —25 ns 7 TCK Low to TDO Data Invalid tTDOI 0— ns 8 TCK Low to TDO High Impedance tTDOHZ —20 ns 9 JCOMP Assertion Time tJCMPPW 100 — ns 10 JCOMP Setup Time to TCK Low tJCMPS 40 — ns 11 TCK Falling Edge to Output Valid tBSDV —50 ns 12 TCK Falling Edge to Output Valid out of High Impedance tBSDVZ —50 ns 13 TCK Falling Edge to Output High Impedance tBSDHZ —50 ns 14 Boundary Scan Input Valid to TCK Rising Edge tBSDST 50 — ns 15 TCK Rising Edge to Boundary Scan Input Invalid tBSDHT 50 — ns TCK 1 2 2 3 3 |
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