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AN4475 Datasheet(PDF) 7 Page - STMicroelectronics

Part # AN4475
Description  Safety Application Guide for SPC563Mxx family
PDF  26 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

AN4475 Datasheet(HTML) 7 Page - STMicroelectronics

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Functional safety requirements for application software
AN4475
8/27
DocID026216 Rev 1
Suggested: [covers: HW_CQM] FMPLL is configured to use the external oscillator
(XTAL_OSC) as their source clock and all safety relevant modules are clocked with the
FMPLL generated clock signal. The CQM loss-of-clock (XTAL_OSC failure, i.e. FMPLL
reference failure) and the CQM loss-of-lock (FMPLL failure) detection is enabled with
relevant ISR request. The management of these errors is application-dependent. These
specific software countermeasures can run once after the Power-On Reset (POR) before
the safety function starts. [end]
Rationale: to reduce the impact of glitches stemming from the external quartz crystal or the
RC_OSC and to check the FMPLL clock integrity.
Suggested: [covers: SW_CQM_SELF_TEST] specific software countermeasures are
implemented to detect CQM permanent faults. These specific software countermeasures
can run once after the Power-On Reset (POR) before the safety application starts. [end]
Implementation hint: This safety mechanism could consist of the following tests: (1) IRC
frequency is measured using CQM and it is checked if the measured value is or not in the
correct range; (2) CQM Crystal clock monitor feature is checked setting a wrong
configuration and servicing the CQM ISR which occurs in this case; (3) CQM0 PLL clock
monitor feature is checked setting a wrong configuration and CGM.CQM_0_LFREFR_A and
servicing the CQM ISR which occurs in this case.
Suggested: [covers: SW_PLL_SELF_TEST] SW checks that the device is using FMPLL
clock as system clock and the integrity of the CQM module before the safety function starts.
[end]
Rationale: to check the correctness of FMPLL configuration and the integrity of the CQM
module.
Implementation hint: e.g. a wrong PLL configuration is set in order to inject a loss-of-lock
and then the CQM response is tested.
2.4
General-Purpose Static RAM (SRAM)
Suggested: [covers: HW_SRAM_ECC] the system SRAM is protected by a single error
correction/dual error detection (SEC/DED) ECC scheme. The SEC/DED ECC scheme
reporting is configured (interrupt request). The SRAM SEC/DED concerns data and not the
addresses. Such configuration has done once after the Power-On Reset (POR) before the
safety application starts. [end]
Suggested: [covers: SW_SRAM_SELF_TEST] in order to increase the diagnostic
coverage, specific software countermeasures are implemented to detect RAM address logic
faults. These specific software countermeasures can run once per FTTI. [end]
Rationale: to verify the integrity of RAM address logic.
Suggested: [covers: SW_SRAM_ECC_SELF_TEST] in order to increase the diagnostic
coverage, specific software countermeasures are implemented to detect fault in the RAM
ECC logic. The aim is to assure that correct data are not accidentally modified and that bit
errors are properly corrected/detected. These specific software countermeasures can run
once per FTTI. [end]
Rationale: to check the correct working of RAM ECC logic.
Implementation hint: ECSM module can force the generation of single-bit and/or double-bit
data inversions in RAM allowing the check of the ECC logic. In particular ECSM module can
generate errors during data write cycles, such that subsequent reads of the corrupted



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