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AN2344 Datasheet(PDF) 7 Page - STMicroelectronics |
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AN2344 Datasheet(HTML) 7 Page - STMicroelectronics |
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7 / 27 page ![]() AN2344 Testing avalanche ruggedness 7/27 2 Testing avalanche ruggedness The avalanche capability of the device is usually evaluated by using a circuit that performs an Unclamped Inductive Switching (UIS) operation like the one shown in Figure 2. The operation is as follows: 1. At zero time, the device switches ON, closing the circuit. 2. The current increases following an exponential law as a function of the L/R characteristics of the circuit, which are caused by the presence of an inductance, given some resistance due to the layout and the MOSFET ON resistance (RDS(ON)). 3. As soon as the device is switched OFF, the dI/dt causes an overvoltage on the drain of the device because the magnetic field in the inductance cannot instantaneously go to zero (see Figure 3.). Figure 2. UIS reference diagram Figure 3. Typical UIS waveforms |
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