LE25S161

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46

16. Specifications

16-1. Absolute Maximum Ratings

Parameter

Sy mbol

Conditions

Ratings

unit

Maximum supply v oltage

With respect to VSS

−0.5 to +2.6

V

DC v oltage (all pins)

With respect to VSS

−0.5 to V

DD+0.5

V

Storage temperature

Tstg

−55 to +150

°C

16-2. Operating Conditions

Parameter

Sy mbol

Conditions

Ratings

unit

Operating supply v oltage

1.65 to 1.95

V

Operating

ambient temperature

−40 to +90

°C

16-3. Data retention, Rewriting cycles

Parameter

Sy mbol

condition

min

max

unit

Rewrite Cy cles

cy cRW

Status resister write

1,000

cy cles/

Sector

Program/Erase

100,000

Data retention

tDRET

20

y ear

16-4. Pin Capacitance at Ta=25

°C, f=1MHz

Parameter

Sy mbol

Conditions

Ratings

unit

max

Output pin capacitance

CSO

VSO=0V

12

pF

Input pin Capacitance

CIN

VIN=0V

6

pF

Note: These parameter values do not represent the results of measurements undertaken for all devices but rather va lues for

some of the sampled devices.

16-5. AC Test Conditions

Input pulse level············· 0.2VDD to 0.8VDD

Input rising/falling time ··· 5ns

Input timing level··········· 0.3VDD, 0.7VDD

Output timing level········· 1/2

×VDD

Output load ··················· 15pF

Note: As the test conditions for "typ", the measurements are conducted using 1.8V for VDD at room temperature.

Input / Output timing level

Input level

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed,

damage may occur and reliability may be affected.

Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended

Operating Ranges limits may affect device reliability.