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SSM5G06FE Datasheet(PDF) 3 Page - Toshiba Semiconductor

Part # SSM5G06FE
Description  Silicon P-Channel MOS Type / Silicon Epitaxial Schottky Barrier Diode
PDF  8 Pages
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Manufacturer  TOSHIBA [Toshiba Semiconductor]
Direct Link  http://www.semicon.toshiba.co.jp/eng
Logo TOSHIBA - Toshiba Semiconductor

SSM5G06FE Datasheet(HTML) 3 Page - Toshiba Semiconductor

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SSM5G06FE
2014-03-01
3
MOSFET
Electrical Characteristics (Ta = 25°C)
Characteristic
Symbol
Test Condition
Min
Typ.
Max
Unit
Gate leakage current
IGSS
VGS = ±10 V, VDS = 0 V
⎯
⎯
±1
μA
Drain-Source breakdown voltage
V (BR) DSS
ID = − 0.1 mA, VGS = 0 V
−20
⎯
⎯
V
Drain Cut-off current
IDSS
VDS = − 20 V, VGS = 0 V
⎯
⎯
−1
μA
Gate threshold voltage
Vth
VDS = − 3 V, ID = − 0.1 mA
−0.6
⎯
−1.1
V
Forward transfer admittance
⏐Yfs⏐
VDS = − 3 V, ID = − 10 mA
(Note 4)
25
⎯
⎯
mS
ID = − 10 mA, VGS = − 4 V
(Note 4)
⎯
6
8
ID = − 10 mA, VGS = − 2.5 V
(Note 4)
⎯
8
12
Drain-Source on-resistance
RDS (ON)
ID = − 1 mA, VGS = − 1.5 V
(Note 4)
⎯
18
45
Ω
Input capacitance
Ciss
VDS = − 3 V, VGS = 0 V, f = 1 MHz
⎯
11
⎯
pF
Reverse transfer capacitance
Crss
VDS = − 3 V, VGS = 0 V, f = 1 MHz
⎯
3.7
⎯
pF
Output capacitance
Coss
VDS = − 3 V, VGS = 0 V, f = 1 MHz
⎯
10
⎯
pF
Turn-on time
ton
⎯
130
⎯
Switching time
Turn-off time
toff
VDD = − 3 V, ID = − 10 mA,
VGS = 0 to − 2.5 V
⎯
190
⎯
ns
Note 4: Pulse test
Switching Time Test Circuit
(a) Test circuit
(b) VIN
Precaution
Vth can be expressed as voltage between gate and source when low operating current value is ID = -100 µA for
this product. For normal switching operation, VGS (on) requires higher voltage than Vth and VGS (off) requires lower
voltage than Vth.
(Relationship can be established as follows: VGS (off) < Vth < VGS (on))
Please take this into consideration for using the device.
VDD = −3 V
Duty
≤ 1%
VIN: tr, tf < 5 ns
(Zout = 50 Ω)
Common Source
Ta
= 25°C
IN
0
−2.5V
10
μs
VDD
OUT
RL
(c) VOUT
ton
10%
90%
−2.5 V
0 V
90%
10%
toff
tr
tf
VDS (ON)
VDD



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