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CLC021 Datasheet(PDF) 12 Page - National Semiconductor (TI) |
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CLC021 Datasheet(HTML) 12 Page - National Semiconductor (TI) |
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12 / 18 page ![]() Device Operation (Continued) TABLE 1. BIST and Test Pattern Generator Control Functions Pin Name Function 12 D0 TPG Code Input LSB 13 D1 TPG Code Input 14 D2 TPG Code Input 15 D3 TPG Code Input MSB 29 TPG_EN TPG Enable, Active High True 3 Test_Out BIST Pass/Fail Output. Pass=High (See text for Timing Requirements) TABLE 2. Component Video Test Pattern Selection Standard Frame Test Pattern D3 D2 D1 D0 NTSC 4x3 Flat-Field Black 0 0 0 0 NTSC 4x3 PLL Pathological 0 0 0 1 NTSC 4x3 EQ Pathological 0 0 1 0 NTSC 4x3 Colour Bars, 75%, 8-Bars (modified, see text), BIST 0 0 1 1 PAL 4x3 Flat-Field Black 0 1 0 0 PAL 4x3 PLL Pathological, BIST 0 1 0 1 PAL 4x3 EQ Pathological 0 1 1 0 PAL 4x3 Colour Bars, 75%, 8-Bars (modified, see text) 0 1 1 1 NTSC 16x9 Flat-Field Black 1 0 0 0 NTSC 16x9 PLL Pathological 1 0 0 1 NTSC 16x9 EQ Pathological 1 0 1 0 NTSC 16x9 Colour Bars, 75%, 8-bars (modified, see text) 1 0 1 1 PAL 16x9 Flat-Field Black 1 1 0 0 PAL 16x9 PLL Pathological 1 1 0 1 PAL 16x9 EQ Pathological 1 1 1 0 PAL 16x9 Colour Bars, 75%, 8-Bars (modified, see text) 1 1 1 1 Note: D9 through D4 = 0 (binary) www.national.com 12 |
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