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TFP501PZP Datasheet(PDF) 6 Page - Texas Instruments |
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TFP501PZP Datasheet(HTML) 6 Page - Texas Instruments |
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6 / 24 page ![]() TFP501 SLDS127C – JULY 2001 – REVISED JULY 2011 www.ti.com DC DIGITAL I/O ELECTRICAL CHARACTERISTICS over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VIH High level digital input voltage (CMOS Inputs)(1) 0.7 V DVDD VIL Low level digital input voltage (CMOS Inputs)(1) 0.3 V DVDD DVDD = 3 V, VOH = –5 V, ST = High 2.4 VOH High level output drive current(2) V DVDD = 3 V, VOH = –3 V, ST = Low 2.4 DVDD = 3.6 V, IOL = 10 mA, ST = High 0.4 VOL Low level digital output voltage (2) V DVDD = 3.6 V, IOL = –3 V, ST = Low 0.4 ST = High, VOH = 2.4 V –5 –12 –18 IOH(D) High level output drive current (2) mA ST = Low, VOH = 2.4 V –3 –7 –12 ST = High, VOH =0.4 V 10 13 19 IOL(D) Low level output drive current(2) mA ST = Low, VOH = 0.4 V 5 7 11 IIH High level digital input current (1) VIH = DVDD ±20 µA IIL Low level digital input current (1) VIL = 0.0 ±60 µA IOZ Hi-Z output leakage current PD = Low or PDO = Low ±20 μA (1) Digital inputs are labeled I in I/O column of Pin Functions Table. (2) Digital outputs are labeled O in I/O column of Pin Functions Table. 6 Copyright © 2001–2011, Texas Instruments Incorporated |
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