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A3924 Datasheet(PDF) 21 Page - Allegro MicroSystems |
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A3924 Datasheet(HTML) 21 Page - Allegro MicroSystems |
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21 / 55 page ![]() Automotive, Full-Bridge MOSFET Driver A3924 21 Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com DIAGNOSTIC MONITORS Multiple diagnostic features provide three levels of fault monitor- ing. These include critical protection for the A3924, monitors for operational voltages and states, and detection of power bridge and load fault conditions. All diagnostics, except for POR, serial transfer error and overtemperature can be masked by setting the appropriate bit in the mask registers. Except for the two phase state outputs, the fault status is available from two sources, the DIAG output terminal and the status and diagnostic registers accessed through the serial interface. DIAG Diagnostic Output The DIAG terminal is a single diagnostic output signal that can be programmed by setting the contents of the DG[1:0] variable through the serial interface to provide one of three dedicated diagnostic signals: • DG = 0: a general fault flag • DG = 1: a pulsed fault flag • DG = 2: a voltage representing the temperature of the internal silicon • DG = 3: the sense amplifier output offset voltage At power-up, or after a power-on-reset, the DIAG terminal outputs a general logic-level fault flag which will be active-low if a fault is present. This fault flag remains low while the fault is present or if one of the latched faults has been detected and the outputs disabled. When the general fault flag is reset the DIAG output will be high. The pulsed fault output option provides a continuous low- frequency low-duty cycle pulsed output when a fault is present or if one of the latched faults has been detected and the outputs disabled. When the general fault flag is reset and no fault is present, the signal output on the DIAG terminal is continuous low-frequency, high-duty cycle pulses. The period of the DIAG signal in pulsed mode is defined by tFP and is typically 100 ms. The two duty cycles are defined by DFP and are typically 20% when a fault is present and 80% when no fault is present. t FP 0.8 t FP 0.2 t FP DIAG: No Fault DIAG: Fault Figure 6: DIAG – Pulsed Output Mode The temperature output option provides access to the internal voltage representing the surface temperature of the silicon. The sense amplifier option provides the output offset voltage, (VOOS) of the sense amplifier, defined by the contents of the SAO[3:0] bits in configuration register 5. Diagnostic Registers The serial interface allows detailed diagnostic information to be read from the diagnostic registers on the SDO output terminal at any time. A system Status register provides a summary of all faults in a single read transaction. The Status register is always output on SDO when any register is written. Table 4: Diagnostic Functions Name Diagnostic Level POR Internal logic supply undervoltage causing power- on reset Chip OT Chip junction overtemperature Chip SE Serial transmission error Chip TW High chip junction temperature warning Monitor VSO VBB supply overvoltage (Load dump detection) Monitor VSU VBB supply undervoltage Monitor VLO Logic terminal overvoltage Monitor ETO ENABLE watchdog timeout Monitor VRO VREG output overvoltage Monitor VRU VREG output undervoltage Monitor V3U V3 Regulator output undervoltage Monitor V3O V3 Regulator output overvoltage Monitor AHU A high-side VGS undervoltage Monitor ALU A low-side VGS undervoltage Monitor BHU B high-side VGS undervoltage Monitor BLU B low-side VGS undervoltage Monitor OCA Overcurrent on phase A Bridge OCB Overcurrent on phase B Bridge OL Open load Bridge VA Bootstrap undervoltage phase A Bridge VB Bootstrap undervoltage phase B Bridge AHO Phase A high-side VDS overvoltage Bridge ALO Phase A low-side VDS overvoltage Bridge BHO Phase B high-side VDS overvoltage Bridge BLO Phase B low-side VDS overvoltage Bridge |
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