| Electronic Components Datasheet Search |
|
LP064V1 Datasheet(PDF) 14 Page - NXP Semiconductors |
|
|
|||||||||||||||||||||||||||||
LP064V1 Datasheet(HTML) 14 Page - NXP Semiconductors |
|
14 / 20 page ![]() LP064V1 LIQUID CRYSTAL DISPLAY SPECIFICATIONS TITLE: LP064V1 REV. 1 PAGE 14 OF 14 DATA DISPLAY AG Industriestrasse 1 D-82110 Germering DEZ 1999 http://www.datadisplay.de Tel.: +49-89-894450-0 Fax: +49-89-894450-90 11. RELIABILITY No. Test ITEM Conditions 1 High temperature storage test Ta = 60° 240 h 2 Low temperature storage test Ta = -20° 240 h 3 High temperature & high humidity operation test Ta = 40° 95% 240 h (no condensation) 4 High temperature operation test Ta = 50° 240 h 5 Low temperature operation test Ta = 0° 240 h 6 Vibration test (non-operating) Frequency: 10~57Hz / Vibration Width (one side): 0.075mm 58 ~ 500Hz / Gravity: 9.8m/s 2 Sweep time: 11 minutes Test period: 3 hours (1 hour for each direction of X,Y,Z) 7 Shock test (non-operating) Max. Gravity: 490 m/s Pulse width: 11 ms, half sine wave Direction: ±X,±Y,±Z one for each direction Result Evaluation Criteria There should be no change which might affect the practical display function when the display quality test is conducted under normal operating condition. In High temperature and low temperature operation test, lamp current should be 5 mA. |
|
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |