ST72361AR4-Auto datasheet(239/279 Pages) STMICROELECTRONICS

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ST72361xx-Auto

Electrical characteristics

Doc ID 12468 Rev 3

239/279

Most of the common failures (unexpected reset and program counter corruption) can be

reproduced by manually forcing a low state on the RESET pin or the Oscillator pins for 1

second.

To complete these trials, ESD stress can be applied directly on the device, over the range of

specification values. When unexpected behavior is detected, the software can be hardened

to prevent unrecoverable errors occurring (see application note AN1015).

19.8.2

Electromagnetic interference (EMI)

Based on a simple application running on the product (toggling two LEDs through the I/O

ports), the product is monitored in terms of emission. This emission test is in line with the

norm SAE J 1752/3 which specifies the board and the loading of each pin.

19.8.3

Absolute maximum ratings (electrical sensitivity)

Based on three different tests (ESD, LU and DLU) using specific measurement methods, the

product is stressed in order to determine its performance in terms of electrical sensitivity

(see Table 111 and Table 112 below). For more details, refer to application note AN1181.

Electrostatic discharge (ESD)

Electrostatic discharges (a positive then a negative pulse separated by 1 second) are

applied to the pins of each sample according to each pin combination. The sample size

Table 101.

EMS test results

Symbol

Parameter

Conditions

Level/

Class

VFESD

Voltage limits to be applied on any I/O pin

to induce a functional disturbance

VDD  5V, TA  +25°C, fOSC  8 MHz

conforms to IEC 1000-4-2

VFFTB

Fast transient voltage burst limits to be

applied through 100pF on VDD and VDD

pins to induce a functional disturbance

VDD  5V, TA  +25°C, fOSC  8 MHz

conforms to IEC 1000-4-4

Table 102.

EMI emissions

Symbol

Parameter

Conditions

Monitored

frequency band

Max vs. [fOSC/fCPU]

(1)

Unit

8/4 MHz

16/8 MHz

SEMI

Peak level

Flash devices: VDD  5V,

TA  +25°C,

LQFP64 package

conforming to SAE J 1752/3

0.1 MHz to 30 MHz

dBµV

30 MHz to 130 MHz

130 MHz to 1 GHz

SAE EMI Level

3.0

3.5

ROM devices: VDD  5V,

TA  +25°C,

LQFP64 package

conforming to SAE J 1752/3

0.1 MHz to 30 MHz

dBµV

30 MHz to 130 MHz

130 MHz to 1 GHz

-3

SAE EMI Level

2.0

2.5

Not tested in production.

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