56F8167 datasheet(146/184 Pages) FREESCALE

146 / 184 page

56F8367 Technical Data, Rev. 7.0

146

Freescale Semiconductor

Preliminary

10.3 AC Electrical Characteristics

Tests are conducted using the input levels specified in Table 10-5. Unless otherwise specified,

propagation delays are measured from the 50% to the 50% point, and rise and fall times are measured

between the 10% and 90% points, as shown in Figure 10-1.

Figure 10-1 Input Signal Measurement References

Figure 10-2 shows the definitions of the following signal states:

•

Active state, when a bus or signal is driven, and enters a low impedance state

•

Tri-stated, when a bus or signal is placed in a high impedance state

•

Data Valid state, when a signal level has reached VOL or VOH

•

Data Invalid state, when a signal level is in transition between VOL and VOH

Figure 10-2 Signal States

10.4 Flash Memory Characteristics

Table 10-12 Flash Timing Parameters

Characteristic

Symbol

Min

Typ

Max

Unit

Program time1

1. There is additional overhead which is part of the programming sequence. See the 56F8300 Peripheral User Manual

for details. Program time is per 16-bit word in Flash memory. Two words at a time can be programmed within the Pro-

gram Flash Module, as it contains two interleaved memories.

Tprog

—

µs

Erase time2

2. Specifies page erase time. There are 512 bytes per page in the Data and Boot Flash memories. The Program Flash

Module uses two interleaved Flash memories, increasing the effective page size to 1024 bytes.

Terase

—

Mass erase time

Tme

100

—

VIH

VIL

Fall Time

Input Signal

Note: The midpoint is VIL + (VIH – VIL)/2.

Midpoint1

Low

High

90%

50%

10%

Rise Time

Data Invalid State

Data1

Data2 Valid

Data

Tri-stated

Data3 Valid

Data2

Data3

Data1 Valid

Data Active

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