4

Notes:

1. Logic will not latchup during radiation exposure within the limits defined in the table.

2. Not tested, inherent of CMOS technology.

ABSOLUTE MAXIMUM RATINGS

1

Note:

1. Stresses outside the listed absolute maximum ratings may cause permanent damage to the device. This is a stress rating only, functional operation of the device

at these or any other conditions beyond limits indicated in the operational sections is not recommended. Exposure to absolute maximum rating conditions for

extended periods may affect device reliability and performance.

DUAL SUPPLY OPERATING CONDITIONS

PARAMETER

LIMIT

UNITS

Total Dose

1.0E5

rad(Si)

SEL Latchup

>120

1.0E14

SYMBOL

PARAMETER

LIMIT (Mil only)

UNITS

V

I/O

Voltage any pin

-.3 to V

V

Supply voltage

-0.3 to 6.0

V

Supply voltage

-0.3 to 6.0

V

T

STG

Storage Temperature range

-65 to +150

°C

T

J

Maximum junction temperature

+175

°C

Θ

JC

Thermal resistance junction to case

20

°C/W

DC input current

±10

mA

P

D

Maximum power dissipation

1

W

SYMBOL

PARAMETER

LIMIT

UNITS

V

DD1

Supply voltage

3.0 to 3.6 or 4.5 to 5.5

V

Supply voltage

3.0 to 3.6 or 4.5 to 5.5

V

Input voltage any pin

V

T

C

Temperature range

-55 to + 125

°C