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VNH7040AY Datasheet(PDF) 35 Page - STMicroelectronics |
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VNH7040AY Datasheet(HTML) 35 Page - STMicroelectronics |
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35 / 48 page ![]() DocID028118 Rev 5 35/48 VNH7040AY Immunity against transient electrical disturbances 47 8 Immunity against transient electrical disturbances The immunity of the device against transient electrical emissions, conducted along the supply lines and injected into the VCC pin, is tested in accordance with ISO7637-2:2011 (E) and ISO 16750-2:2010. The related function performance status classification is shown in Table 15: ISO 7637-2 electrical transient conduction along supply line. Test pulses are applied directly to DUT (Device Under Test) both in ON and OFF-state and in accordance to ISO 7637-2:2011(E), Section 4. The DUT is intended as the present device only, without components and accessed through VCC and GND terminals. Status II is defined in ISO 7637-1 Function Performance Status Classification (FPSC) as follows: “The function does not perform as designed during the test but returns automatically to normal operation after the test”. Test pulse 2011(E) Test pulse severity level with status II functional performance status Minimum number of pulses or test time Burst cycle/pulse repetition time Pulse duration and pulse generator internal impedance Level US(1) Table 15. ISO 7637-2 electrical transient conduction along supply line 1. US is the peak amplitude as defined for each test pulse in ISO 7637-2:2011(E) min. max. 1 III -112 V 500 pulses 0.5 s 2 ms, 10 Ω 2a III +55 500 pulses 0.2 s 5 s 50 μs, 2 Ω 3a IV -220 V 1h 90 ms 100 ms 0.1 μs, 50 Ω 3b IV +150 V 1h 90 ms 100 ms 0.1 μs, 50 Ω 4(2) 2. Test pulse from ISO 7637-2:2004(E) IV -7 V 1 pulse 100 ms, 0.01 Ω Load dump according to ISO 16750-2:2010 Test B(3) 3. With 40 V external suppressor referred to ground (-40 °C < TJ < 150 °C) 40 V 5 pulse 1 min 400 ms, 2 Ω |
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