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STLD257N4F7AG Datasheet(PDF) 4 Page - STMicroelectronics |
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STLD257N4F7AG Datasheet(HTML) 4 Page - STMicroelectronics |
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4 / 13 page ![]() Table 7. Source-drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit ISD(1) Source-drain current - 120 A ISDM(1)(2) Source-drain current (pulsed) - 480 A VSD (3) Forward on voltage VGS = 0 V, ISD = 90 A - 1.1 V trr Reverse recovery time ISD = 120 A, di/dt = 100 A/µs, VDD = 20 V (see Figure 14. Test circuit for inductive load switching and diode recovery times) - 54 ns Qrr Reverse recovery charge - 53 nC IRRM Reverse recovery current - 1.9 A 1. Limited by package. 2. Pulse width is limited by safe operating area. 3. Pulse test: pulse duration = 300 µs, duty cycle 1.5% STLD257N4F7AG Electrical characteristics DS12565 - Rev 4 page 4/13 |
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