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UT7C138C45WPC Datasheet(PDF) 16 Page - Aeroflex Circuit Technology |
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UT7C138C45WPC Datasheet(HTML) 16 Page - Aeroflex Circuit Technology |
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16 / 21 page ![]() 16 DATA RETENTION CHARACTERISTICS (Pre-Radiation) (TC = 25°C) Notes: 1. CE equals VDR, all other inputs equal VDR or VSS. 2. Guaranteed but not tested. SYMBOL PARAMETER MINIMUM MAXIMUM VDD @ 2.5V UNIT VDR VDD for data retention 2.5 -- V IDDR 1 Data retention current -- 400 µA t EFR 1,2 Chip deselect to data retention time 0 ns tR 1,2 Operation recovery time tWC or tRC ns VDD CE DATA RETENTION MODE t R 4.5V 4.5V VDR 2.5V Figure 6. Low VDD Data Retention Waveform t EFR V DR VIN < 1.5V CMOS Notes: 1. 50pF including scope probe and test socket. 2. Measurement of data output occurs at the low to high or high to low transition mid-point (CMOS input = VDD/2). 90% Figure 7. AC Test Loads and Input Waveforms Input Pulses 10% < 5ns < 5ns 460 ohms VDD/2 50pF CMOS 0.5V VDD-0.5V |
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