6

Radiations

6.1

Total ionizing dose (MIL-STD-883 test method 1019)

The products that are guaranteed in radiation within RHA QML-V system, fully comply with the MIL- STD-883test

method 1019 specification. The RHFL6000L is being RHA QML-V qualified. It is covered by similarity with

RHFL6000A tested and characterized in full compliance with the MIL-STD-883 specification, both below 10

mrad/s (low dose rate) and between 50 and 300 rad/s (high dose rate).

•

Testing is performed in accordance with MIL-prf-38535 and the test method 1019 of the MIL- STD-883 for

total ionizing dose (TID).

•

ELDRS characterization is performed on RHFL6000A in qualification only on both biased and unbiased

parts, on a sample of ten units from two different wafer lots.The RHFL6000L is covered by similarity.

•

Each wafer lot is tested at high dose rate only, in the worst bias case condition, based on the results

obtained during the initial qualification.

Table 6. TID tests results

Type

Conditions

Value

Unit

TID

50 rad(Si)/s high dose rate up to

300

krad

10 mrad(Si)/s low dose rate up to

300

ELDRS free up to

300

Output voltage radiation drift

From 0 krad to 300 krad at 50 rad/s, MIL-

STD-883J method 1019.9

< 1.1

ppm/krad

Quiescent current (ON-state)

From 0 krad to 300 krad at 50 rad/s, MIL-

STD-883J method 1019.9

VI = 2.5 V to 12 V, IO = 5 to 30 mA, TJ = - 55

to +125 °C

< 30

mA

6.2

Heavy-ions

The heavy-ion trials are performed on qualification lots only. No additional test is performed.

Focus was on the configuration for VO = 0.6 V but the results can be extrapolated to any VO < 1.25 V for the

expected accuracy, provided that the scheme shown in Figure 7. Heavy-ion test configuration for VOUT < 1.25 V

and the BOM list in Table 9 be adopted.

For VO ≥ 1.25 V, the conclusions obtained on the former RHFL6000A device apply if compliant with the guidelines

indicated in the AN5175 document.

Table 7. Heavy-ion results summarizes the results of heavy-ion tests.

Table 7. Heavy-ion results

Feature

Conditions

Value

Unit

SEL/B performance

LET = 120 MeV*cm2/mg VI = 12 V

No latch-up/burn-out

-

SET performance during events

LET = 120 MeV*cm2/mg; VI – VO = 2.5 V

(1); IOUT ≤ 1 A:

No SET above ± 3.3 %

% of VO

1. For VO < 1.25 V, the SET accuracy within X % is guaranteed only for VI - VO ≤ 2.5 V. For this, VI = 1.25 + 2.5 V = 3.75 V is

expected to be the max. limit of interest in the VO output range of concern.

SEL and SET performances described here below are related to the circuit configuration and bias conditions

shown in Figure 7. Heavy-ion test configuration for VOUT < 1.25 V and Table 8. Bias configurations and

Table 9. Test configurations.

RHFL6000L

Radiations

DS14125 - Rev 1

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