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ISL71841SEHF/PROTO Datasheet(PDF) 8 Page - Renesas Technology Corp |
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ISL71841SEHF/PROTO Datasheet(HTML) 8 Page - Renesas Technology Corp |
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8 / 30 page ![]() ISL71841SEH FN8735 Rev. 7.00 Page 8 of 30 Feb 23, 2018 Electrical Specifications (±12V) V+ = 12V, V- = -12V, V AH = 4.0V, VAL = 0.8V, VREF = VEN = 5.0V, TA= +25°C, unless otherwise noted. Boldface limits apply across the operating temperature range, -55°C to +125°C or across a total ionizing dose of 300krad(Si) with exposure of a high dose rate of 50 to 300krad(Si)/s or a total ionizing dose of 50krad(Si) with exposure at a low dose rate of <10mrad(Si)/s. PARAMETER SYMBOL TEST CONDITIONS MIN (Note 10)TYP MAX (Note 10)UNIT Analog Input Signal Range VS V- V+ V Channel ON-Resistance rON V± = ±10.8V, ±13.2V IOUT = -1mA, VIN = +5V, -5V -- 500 Ω V± = ±10.8V, ±13.2V IOUT = -1mA, VIN = V+, V- -- 700 Ω rON Match Between Channels ΔrON VIN = +5V, -5V; IOUT = -1mA - 10 20 Ω ON-Resistance Flatness RFLAT(ON) VIN = +5V, -5V, V± = ±13.2V - - 25 Ω VIN = +5V, -5V, V± = ±10.8V, TA = +25°C, -55°C, +125°C -- 30 Ω VIN = +5V, -5V, V± = ±10.8V, post radiation, TA = +25°C -- 40 Ω Quiescent Supply Current I+ VIN = VA = VEN = 0.8V, V± = ±10.8V, ±13.2V - - 400 µA Quiescent Supply Current I- VIN = VA = VEN = 0.8V, V± = ±10.8V, ±13.2V -400 -- µA Standby Supply Current I+ VIN = VA = VEN = 4.0V, V± = ±10.8V, ±13.2V - - 400 µA Standby Supply Current I- VIN = VA = VEN = 4.0V, V± = ±10.8V, ±13.2V -400 -- µA Supply Current Into VREF IREF VREF = 5.5V, VIN = VA = VEN = 0.8V, V± = ±10.8V, ±13.2V -- 35 µA DYNAMIC Transition Time tALH Figures 5, 6 -0.5 800 ns Transition Time tAHL Figures 5, 6 -0.5 800 ns Break-Before-Make Delay tBBM Figures 9, 10 TA = -55°C, +25°C, +125°C 5 50 200 ns Post radiation 5 - 400 ns Enable Turn-On Time tENABLE Figures 7, 8 TA = -55°C, +25°C, +125°C - 0.5 600 ns Post radiation - - 800 ns Disable Turn-Off Time tDISABLE Figures 7, 8 TA = -55°C, +25°C, +125°C - 0.5 600 ns Post radiation - - 800 ns NOTE: 10. Compliance to datasheet limits is assured by one or more methods: production test, characterization, and/or design. |
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