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TMUX7348FPWTEP Datasheet(PDF) 45 Page - Texas Instruments |
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TMUX7348FPWTEP Datasheet(HTML) 45 Page - Texas Instruments |
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45 / 54 page ![]() 10 Device and Documentation Support 10.1 Documentation Support 10.1.1 Related Documentation • Texas Instruments, Eliminate Power Sequencing with Powered-Off Protection Signal Switches application brief • Texas Instruments, Implications of Slow or Floating CMOS Inputs application note • Texas Instruments, Improving Analog Input Modules Reliability Using Fault Protected Multiplexers application report • Texas Instruments, Multiplexers and Signal Switches Glossary application report • Texas Instruments, Protection Against Overvoltage Events, Miswiring, and Common Mode Voltages application report • Texas Instruments, Using Latch-Up Immune Multiplexers to Help Improve System Reliability application report 10.2 Receiving Notification of Documentation Updates To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on Notifications to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document. 10.3 Support Resources TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight from the experts. Search existing answers or ask your own question to get the quick design help you need. Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. 10.4 Trademarks TI E2E™ is a trademark of Texas Instruments. All trademarks are the property of their respective owners. 10.5 Electrostatic Discharge Caution This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 10.6 Glossary TI Glossary This glossary lists and explains terms, acronyms, and definitions. 11 Revision History NOTE: Page numbers for previous revisions may differ from page numbers in the current version. Changes from Revision * (November 2023) to Revision A (January 2025) Page • Changed the status from: Advanced Information to Production Data ............................................................... 1 DATE REVISION NOTES November 2023 * Initial Release www.ti.com TMUX7348F-EP SCDS461A – NOVEMBER 2023 – REVISED JANUARY 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 45 Product Folder Links: TMUX7348F-EP |
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