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LMH0318RTWR Datasheet(PDF) 8 Page - Texas Instruments

Part # LMH0318RTWR
Description  LMH0318 3 Gbps HD/SD SDI Reclocker with Integrated Cable Driver
PDF  59 Pages
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Manufacturer  TI2 [Texas Instruments]
Direct Link  https://www.ti.com
Logo TI2 - Texas Instruments

LMH0318RTWR Datasheet(HTML) 8 Page - Texas Instruments

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LMH0318
SNLS508 – SEPTEMBER 2015
www.ti.com
Electrical Characteristics (continued)
Over operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
3.3-V TOLERANT LVCMOS / LVTTL DC SPECIFICATIONS (SDA, SCL, LOS_INT_N)
VIH25
High level input voltage
2.5 V Supply Voltage
1.75
3.6
V
VIL
Low level input voltage
GND
0.8
V
VOL
Low level output voltage
IOL = 1.25 mA
0.4
V
IIH
Input high current
VIN = 2.5 V, VDD = 2.5 V
20
40
μA
IIL
Input low current
VIN = GND, VDD = 2.5 V
-10
10
μA
SIGNAL DETECT
SDH
Signal detect (default)
2.97 Gbps, EQ
22
mVP-P
Assert threshold level(1)(2)
Pathological Pattern
2.97 Gbps, PLL
22
mVP-P
Pathological Pattern
2.97 Gbps, PRBS10
22
mVP-P
Pattern
SDL
Signal detect (default)
2.97 Gbps EQ
16
mVP-P
De-assert threshold
Pathological Pattern
level(1)
2.97 Gbps, PLL
16
mVP-P
Pathological Pattern
2.97 Gbps, PRBS10
9
mVP-P
Pattern
HIGH SPEED RECEIVE RX INPUTS (IN_n+, IN_n-)
R_RD
DC Input differential
75
100
125
Ω
resistance
RLRX-SDD
Input differential return
Measured with the device
loss(3)(4)
powered up.
-14
dB
SDD11 10 MHz to 2 GHz
SDD11 2 GHz to 3 GHz
-6.5
dB
RLRX-SCD
Differential to common
Measure with the device
mode Input
powered up.SCD11, 10
-20
dB
conversion(3)(4)
MHz to 3 GHz
HIGH SPEED OUTPUTS (OUT_n+, OUT_n-)
VVOD_OUT1
Output differential
Default setting, 8T clock
400
600
700
mVP-P
voltage(3)(4)
pattern
VVOD_OUT1_DE
De-emphasis Level
VOD = 600mV, maximum
De-Emphasis with 16T
-9
dB
clock pattern
VVOD_OUT1_CLK
Clock output differential
2.97 GHz,1.485 GHz, and
560
mVP-P
voltage
270 MHz
VVOD_OUT0
Output single ended
Default setting
voltage at OUT0+ with
720
800
880
mVP-P
OUT0- terminated(5)(3)
RDIFF_OUT1
DC output differential
100
Ω
resistance
(1)
Data with extraordinarily long periods of high-frequency 1010 data, and for long, lossy channels, the signal amplitude at the input to the
device may be severely attenuated by the channel and may fall below the signal detect assert and/or de-assert thresholds.
(2)
The voltage noise on the receiver inputs which has an amplitude larger than the signal detect assert threshold may trigger a signal
detect assert condition
(3)
These limits are ensured by bench characterization and are not production tested.
(4)
Dependent on board layout. Characterization data was measured with LMH1218EVM evaluation board
(5)
ATE Production tested using DC method. Apply differential DC signal at the input and measure OUT0P amplitude. OUT0N terminated in
75 Ohm.
8
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Copyright © 2015, Texas Instruments Incorporated
Product Folder Links: LMH0318



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