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LMH6580VS/NOPB Datasheet(PDF) 5 Page - Texas Instruments |
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LMH6580VS/NOPB Datasheet(HTML) 5 Page - Texas Instruments |
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5 / 32 page ![]() LMH6580, LMH6581 www.ti.com SNOSAY4C – AUGUST 2007 – REVISED MAY 2013 ±5V ELECTRICAL CHARACTERISTICS (1) Unless otherwise specified, typical conditions are: TA = 25°C, AV = +2, VS = ±5V, RL = 100Ω; Boldface limits apply at the temperature extremes. Symbol Parameter Conditions Min(2) Typ(3) Max(2) Units Frequency Domain Performance SSBW −3 dB Bandwidth VOUT = 0.5 VPP (4) 450 LMH6580 VOUT = 1 VPP, 500 LMH6581 VOUT = 2 VPP, RL = 1 kΩ MHz LSBW LMH6580 VOUT = 1 VPP, 450 LMH6581 VOUT = 2 VPP, RL = 150Ω GF 0.1 dB Gain Flatness LMH6580, VOUT = 1 VPP, 100 MHz LMH6581, VOUT = 2 VPP, RL = 150Ω DG Differential Gain RL = 150Ω, 3.58 MHz/4.43 MHz .05 % DP Differential Phase RL = 150Ω, 3.58 MHz/4.43 MHz .05 deg Time Domain Response tr Rise Time LMH6580 2V, Step, 10% to 90% 2.8 ns LMH6581 2V, Step, 10% to 90% 1.2 tf Fall Time 2V Step, 10% to 90% 1.6 ns OS Overshoot 2V Step <1 % SR Slew Rate LMH6580, 2 VPP, 40% to 60% (5) 1200 V/µs SR Slew Rate LMH6581, 6 VPP, 40% to 60% (5) 2100 V/µs ts Settling Time 2V Step, VOUT Within 0.5% 6 ns Distortion And Noise Response HD2 2nd Harmonic Distortion 2 VPP, 5 MHz −80 dBc HD3 3rd Harmonic Distortion 2 VPP, 5 MHz −70 dBc en Input Referred Voltage Noise >1 MHz 12 nV/ √Hz in Input Referred Noise Current >1 MHz 2 pA/ √Hz XTLK Cross Talk All Hostile, f = 100 MHz −45 dBc Channel to Channel, f = 100 MHz −52 dBc ISOL Off Isolation f = 100 MHz −65 dBc Static, DC Performance AV Gain LMH6581 1.986 2.00 2.014 LMH6580 0.995 1.00 1.005 Vos Input Offset Voltage ±2 ±17 mV TCVos Input Offset Voltage Average Drift See(6) 38 µV/°C IB Input Bias Current Non-Inverting(7) −5 ±12 µA TCIB Input Bias Current Average Drift Non-Inverting(6) −12 nA/°C VO Output Voltage Range LMH681, RL = 100Ω ±3.4 ±3.6 V LMH6580, RL = 100Ω ±2.9 ±3.0 VO Output Voltage Range LMH6581, RL = ∞Ω ±3.7 ±3.9 V LMH6580, RL = ∞Ω ±2.9 ±3.0 PSRR Power Supply Rejection Ratio DC −42 −45 dBc (1) Electrical Table values apply only for factory testing conditions at the temperature indicated. No ensured parametric performance is indicated in the electrical tables under conditions different than those tested. (2) Room Temperature limits are 100% production tested at 25°C. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. Limits over the operating temperature range are specified through correlation using Statistical Quality Control (SQC) methods. (3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped production material. (4) This parameter is specified by design and/or characterization and is not tested in production. (5) Slew Rate is the average of the rising and falling edges. (6) Drift determined by dividing the change in parameter at temperature extremes by the total temperature change. (7) Negative input current implies current flowing out of the device. Copyright © 2007–2013, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Links: LMH6580 LMH6581 |
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