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MPC5643L Datasheet(PDF) 21 Page - Freescale Semiconductor, Inc

Part # MPC5643L
Description  High-performance e200z4d dual core
PDF  124 Pages
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Manufacturer  FREESCALE [Freescale Semiconductor, Inc]
Direct Link  http://www.freescale.com
Logo FREESCALE - Freescale Semiconductor, Inc

MPC5643L Datasheet(HTML) 21 Page - Freescale Semiconductor, Inc

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Introduction
MPC5643L Microcontroller Data Sheet, Rev. 6
Preliminary—Subject to Change Without Notice
Freescale Semiconductor
21
—JCOMP
•
Selectable modes of operation include JTAGC/debug or normal system operation
•
5-bit instruction register that supports the following IEEE 1149.1-2001 defined instructions:
—BYPASS
— IDCODE
—EXTEST
—SAMPLE
— SAMPLE/PRELOAD
•
3 test data registers: a bypass register, a boundary scan register, and a device identification register. The size of the
boundary scan register is parameterized to support a variety of boundary scan chain lengths.
•
TAP controller state machine that controls the operation of the data registers, instruction register and associated
circuitry
1.6.40
Voltage regulator / Power Management Unit (PMU)
The on-chip voltage regulator module provides the following features:
•
Single external rail required
•
Single high supply required: nominal 3.3 V both for packaged and Known Good Die option
— Packaged option requires external ballast transistor due to reduced dissipation capacity at high temperature but
can use embedded transistor if power dissipation is maintained within package dissipation capacity (lower
frequency of operation)
— Known Good Die option uses embedded ballast transistor as dissipation capacity is increased to reduce system
cost
•
All I/Os are at same voltage as external supply (3.3 V nominal)
•
Duplicated Low-Voltage Detectors (LVD) to guarantee proper operation at all stages (reset, configuration, normal
operation) and, to maximize safety coverage, one LVD can be tested while the other operates (on-line self-testing
feature)
1.6.41
Built-In Self-Test (BIST) capability
This device includes the following protection against latent faults:
•
Boot-time Memory Built-In Self-Test (MBIST)
•
Boot-time scan-based Logic Built-In Self-Test (LBIST)
•
Run-time ADC Built-In Self-Test (BIST)
•
Run-time Built-In Self Test of LVDs



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