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SPC564L54L5 Datasheet(PDF) 122 Page - STMicroelectronics |
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SPC564L54L5 Datasheet(HTML) 122 Page - STMicroelectronics |
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122 / 160 page ![]() Electrical characteristics SPC56XL60/54 122/160 Doc ID 15457 Rev 8 3.17 SWG electrical characteristics Table 29. Flash memory module life No. Symbol Parameter Value Unit Minimum Typical Maximum 1P/E C Number of program/erase cycles per block for 16 KB, 48 KB, and 64 KB blocks over the operating temperature range(1) 100000 — — cycles 2P/E C Number of program/erase cycles per block for 128 KB and 256 KB blocks over the operating temperature range(1) 1000 100000(2) — cycles 3 Retention C Minimum data retention at 85 °C average ambient temperature(3) Blocks with 0–1,000 P/E cycles Blocks with 1,001–10,000 P/E cycles Blocks with 10,001–100,000 P/E cycles 20 10 5 — — — — — — years 1. Operating temperature range is TJ from –40 °C to 150 °C. Typical endurance is evaluated at 25 °C. 2. Typical P/E cycles is 100,000 cycles for 128 KB and 256 KB blocks. 3. Ambient temperature averaged over duration of application, not to exceed product operating temperature range. Table 30. MPC5643L SWG Specifications Symbol Parameter Value Minimum Typical Maximum T Input clock 12 MHz 16 MHz 20 MHz T Frequency Range 1kHz — 50 kHz T Peak to Peak(1) 0.4 V — 2.0V T Peak to Peak variation(2) -6% — 6% T Common Mode(3) — 1.3 V — T Common Mode variation -6% — 6% T SiNAD(4) 45 dB — — T Load C 25 pF — 100 pF T Load I 0 µA — 100 µA T ESD Pad Resistance(5) 230 Ω —360 Ω 1. Peak to Peak value is measured with no R or I load. 2. Peak to Peak excludes noise, SiNAD must be considered. 3. Common mode value is measured with no R or I load. 4. SiNAD is measured at Max Peak to Peak voltage. 5. Internal device routing resistance. ESD pad resistance is in series and must be considered for max Peak to Peak voltages, depending on application I load and/or R load. |
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