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PIC16F1459-ESSQTP Datasheet(PDF) 311 Page - Microchip Technology |
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PIC16F1459-ESSQTP Datasheet(HTML) 311 Page - Microchip Technology |
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311 / 418 page ![]() 2012 Microchip Technology Inc. Preliminary DS41639A-page 311 PIC16(L)F1454/5/9 26.2.2.1 Internal Transceiver The USB peripheral has a full-speed and low-speed USB 2.0 capable transceiver internally built-in and connected to the SIE. The internal transceiver is enabled when the USBEN bit of the USBCON register is set. Full-speed operation is selected by setting the FSEN bit of the UCFG register. The on-chip USB pull-up resistors are controlled by the UPUEN bit of the USFG register. The pull-up resistors can only be active when the USBEN bit of the USBCON register is set and the module is configured for use. The internal USB transceiver is powered from the VUSB3V3 pin. In order to meet USB signaling level specifications, VUSB3V3 must be supplied with a voltage source between 3.0V and 3.6V. The best electrical signal quality is obtained when a 3.3V supply is used and locally bypassed with a high quality ceramic capacitor. The capacitor should be placed as close as possible to the VUSB3V3 and VSS pins. The D+ and D- signal lines can be routed directly to their respective pins on the USB connector or cable (for hard-wired applications). No additional resistors, capacitors, or magnetic components are required as the D+ and D- drivers have controlled slew rate and output impedance intended to match with the characteristic impedance of the USB cable. See the USB specifications for the impedance matching requirements. 26.2.2.2 Internal Pull-Up Resistors The PIC® devices have built-in pull-up resistors designed to meet the requirements for low-speed and full-speed USB. The UPUEN bit of the UCFG register enables the internal pull-ups. 26.2.2.3 Ping-Pong Buffer Configuration The usage of ping-pong buffers is configured using the PPB bits of the UCFG register. Refer to Section 26.4.4 “Ping-Pong Buffering” for a complete explanation of the ping-pong buffers. 26.2.2.4 Eye Pattern Test Enable An automatic eye pattern test can be generated by setting the UTEYE bit of the USFG register. The eye pattern output is dependent upon the USB modules settings, which must be configured prior to use. The module must be enabled for eye pattern output to function. Once UTEYE is set, the module emulates a switch from a receive to transmit state and will start transmitting a J-K-J-K bit sequence (K-J-K-J for full speed). The sequence will be repeated indefinitely while the Eye Pattern Test mode is enabled. This test mode is intended for board verification to aid with USB certification tests. It is intended to show a system developer the noise integrity of the USB signals which can be affected by board traces, impedance mismatches and proximity to other system components. It does not properly test the transition from a receive to a transmit state. Although the eye pattern is not meant to replace the more complex USB certification test, it should aid during first order system debugging. Note: The VUSB3V3 voltage is supplied. Note: The official USB specifications require the that USB devices must never source any current onto the VBUS line of the USB cable. Additionally, USB devices must never source any current on the D+/D- data lines when the VBUS is below the required voltage. In order to meet this requirement, applications which are not purely bus powered should monitor the VBUS line and avoid turning on the USB module and D+/D- internal pull-up resis- tors until the VBUS meets requirements. VBUS can be connected to and monitored by any 5V tolerant I/O pin for this purpose. Refer to USB Specification 2.0, 7.2.1 for information. Note: The UTEYE bit should never be set while the module is connected to an actual USB system. |
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